Two-Fraction Electron System on a Thin Helium Film

Kurzanzeige
dc.contributor.authorKlier, Jürgendeu
dc.contributor.authorGünzler, Tobiasdeu
dc.contributor.authorWürl, Andreasdeu
dc.contributor.authorLeiderer, Paul
dc.contributor.authorMistura, Giampaolodeu
dc.contributor.authorTeske, Ekkeharddeu
dc.contributor.authorWyder, Peterdeu
dc.contributor.authorShikin, Valerideu
dc.date.accessioned2011-03-24T14:52:12Zdeu
dc.date.available2011-03-24T14:52:12Zdeu
dc.date.issued2001deu
dc.description.abstractA systematic theoretical investigation of microwave absorption of 2-dimensional electron systems above a thin helium film in the presence of a cyclotron resonance magnetic field is presented. To explain the measured data, a two-fraction structure of the electron system is introduced. One component corresponds to the free electron motion, the second one takes into account electron localization near the potential minimum caused by the roughness of the substrate. Within this model the general dependence of microwave absorption becomes understandable. The details of the observed cyclotron resonance line-shift are discussed.eng
dc.description.versionpublished
dc.format.mimetypeapplication/pdfdeu
dc.identifier.citationFirst publ. in: Journal of Low Temperature Physics 122 (2001), 3-4, pp. 451-458deu
dc.identifier.doi10.1023/A:1004825623286
dc.identifier.ppn264923332deu
dc.identifier.urihttp://kops.uni-konstanz.de/handle/123456789/4969
dc.language.isoengdeu
dc.legacy.dateIssued2007deu
dc.rightsAttribution-NonCommercial-NoDerivs 2.0 Generic
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/
dc.subject.ddc530deu
dc.subject.pacs67.70.+ndeu
dc.subject.pacs68.15.+edeu
dc.subject.pacs76.40.+bdeu
dc.titleTwo-Fraction Electron System on a Thin Helium Filmeng
dc.typeJOURNAL_ARTICLEdeu
dspace.entity.typePublication
kops.citation.bibtex
@article{Klier2001TwoFr-4969,
  year={2001},
  doi={10.1023/A:1004825623286},
  title={Two-Fraction Electron System on a Thin Helium Film},
  number={3-4},
  volume={122},
  journal={Journal of Low Temperature Physics},
  pages={451--458},
  author={Klier, Jürgen and Günzler, Tobias and Würl, Andreas and Leiderer, Paul and Mistura, Giampaolo and Teske, Ekkehard and Wyder, Peter and Shikin, Valeri}
}
kops.citation.iso690KLIER, Jürgen, Tobias GÜNZLER, Andreas WÜRL, Paul LEIDERER, Giampaolo MISTURA, Ekkehard TESKE, Peter WYDER, Valeri SHIKIN, 2001. Two-Fraction Electron System on a Thin Helium Film. In: Journal of Low Temperature Physics. 2001, 122(3-4), pp. 451-458. Available under: doi: 10.1023/A:1004825623286deu
kops.citation.iso690KLIER, Jürgen, Tobias GÜNZLER, Andreas WÜRL, Paul LEIDERER, Giampaolo MISTURA, Ekkehard TESKE, Peter WYDER, Valeri SHIKIN, 2001. Two-Fraction Electron System on a Thin Helium Film. In: Journal of Low Temperature Physics. 2001, 122(3-4), pp. 451-458. Available under: doi: 10.1023/A:1004825623286eng
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