Publikation:

Two-Fraction Electron System on a Thin Helium Film

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290_jlowtempph_2001.pdf
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2001

Autor:innen

Klier, Jürgen
Günzler, Tobias
Würl, Andreas
Mistura, Giampaolo
Teske, Ekkehard
Wyder, Peter
Shikin, Valeri

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Journal of Low Temperature Physics. 2001, 122(3-4), pp. 451-458. Available under: doi: 10.1023/A:1004825623286

Zusammenfassung

A systematic theoretical investigation of microwave absorption of 2-dimensional electron systems above a thin helium film in the presence of a cyclotron resonance magnetic field is presented. To explain the measured data, a two-fraction structure of the electron system is introduced. One component corresponds to the free electron motion, the second one takes into account electron localization near the potential minimum caused by the roughness of the substrate. Within this model the general dependence of microwave absorption becomes understandable. The details of the observed cyclotron resonance line-shift are discussed.

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530 Physik

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ISO 690KLIER, Jürgen, Tobias GÜNZLER, Andreas WÜRL, Paul LEIDERER, Giampaolo MISTURA, Ekkehard TESKE, Peter WYDER, Valeri SHIKIN, 2001. Two-Fraction Electron System on a Thin Helium Film. In: Journal of Low Temperature Physics. 2001, 122(3-4), pp. 451-458. Available under: doi: 10.1023/A:1004825623286
BibTex
@article{Klier2001TwoFr-4969,
  year={2001},
  doi={10.1023/A:1004825623286},
  title={Two-Fraction Electron System on a Thin Helium Film},
  number={3-4},
  volume={122},
  journal={Journal of Low Temperature Physics},
  pages={451--458},
  author={Klier, Jürgen and Günzler, Tobias and Würl, Andreas and Leiderer, Paul and Mistura, Giampaolo and Teske, Ekkehard and Wyder, Peter and Shikin, Valeri}
}
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