Using visual analytics to analyze movement and action patterns

Publikationstyp: Beitrag zu einer Konferenz
Publikationsstatus: Published
Autor/innen: Streeb, Dirk; Schlegel, Udo; Buchmüller, Juri; Fischer, Fabian; Keim, Daniel A.
Erscheinungsjahr: 2015
Konferenz: IEEE Conference on Visual Analytics Science and Technology (VAST), 25. Okt 2015 - 30. Okt 2015, Chicago, IL, USA
Erschienen in: 2015 IEEE Conference on Visual Analytics Science and Technology : Proceedings : Chicago, Illinois, USA, 25-30 October 2015 / Chen, Min et al. (Hrsg.). - Piscataway, NJ : IEEE, 2015. - S. 171-172. - ISBN 978-1-4673-9783-4
DOI (zitierfähiger Link): https://dx.doi.org/10.1109/VAST.2015.7347665
Zusammenfassung:
This paper describes our approach and tools used to solve this year's VAST 2015 Mini-Challange 1 (MC1). It also explains how we came up with the idea for a new tool created for solving of the challenge and how this tool helps the user analyzing the data. Further, preprocessing steps will be discussed and how new features were created to be able to cluster guests in goups walking together. Finally findings of this visualization will be presented.
Fachgebiet (DDC): 004 Informatik
Universitätsbibliographie: Ja

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STREEB, Dirk, Udo SCHLEGEL, Juri BUCHMÜLLER, Fabian FISCHER, Daniel A. KEIM, 2015. Using visual analytics to analyze movement and action patterns. IEEE Conference on Visual Analytics Science and Technology (VAST). Chicago, IL, USA, 25. Okt 2015 - 30. Okt 2015. In: CHEN, Min, ed. and others. 2015 IEEE Conference on Visual Analytics Science and Technology : Proceedings : Chicago, Illinois, USA, 25-30 October 2015. IEEE Conference on Visual Analytics Science and Technology (VAST). Chicago, IL, USA, 25. Okt 2015 - 30. Okt 2015. Piscataway, NJ:IEEE, pp. 171-172. ISBN 978-1-4673-9783-4

@inproceedings{Streeb2015-10Using-33500, title={Using visual analytics to analyze movement and action patterns}, year={2015}, doi={10.1109/VAST.2015.7347665}, isbn={978-1-4673-9783-4}, address={Piscataway, NJ}, publisher={IEEE}, booktitle={2015 IEEE Conference on Visual Analytics Science and Technology : Proceedings : Chicago, Illinois, USA, 25-30 October 2015}, pages={171--172}, editor={Chen, Min}, author={Streeb, Dirk and Schlegel, Udo and Buchmüller, Juri and Fischer, Fabian and Keim, Daniel A.} }

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