Heavily phosphorous-doped Germanium thin films for mid-infrared plasmonics

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FRIGERIO, Jacopo, Leonetta BALDASSARRE, Emilie SAKAT, Antonio SAMARELLI, Kevin GALLACHER, Marco FISCHER, Daniele BRIDA, Douglas J. PAUL, Giovanni ISELLA, Paolo BIAGIONI, Michele ORTOLANI, 2015. Heavily phosphorous-doped Germanium thin films for mid-infrared plasmonics. 2015 IEEE 12th International Conference on Group IV Photonics (GFP). Vancouver, BC, Canada, 26. Aug 2015 - 28. Aug 2015. In: 2015 IEEE 12th International Conference on Group IV Photonics (GFP). 2015 IEEE 12th International Conference on Group IV Photonics (GFP). Vancouver, BC, Canada, 26. Aug 2015 - 28. Aug 2015. IEEE, pp. 94-95. ISBN 978-1-4799-8255-4

@inproceedings{Frigerio2015-08Heavi-33196, title={Heavily phosphorous-doped Germanium thin films for mid-infrared plasmonics}, year={2015}, doi={10.1109/Group4.2015.7305964}, isbn={978-1-4799-8255-4}, publisher={IEEE}, booktitle={2015 IEEE 12th International Conference on Group IV Photonics (GFP)}, pages={94--95}, author={Frigerio, Jacopo and Baldassarre, Leonetta and Sakat, Emilie and Samarelli, Antonio and Gallacher, Kevin and Fischer, Marco and Brida, Daniele and Paul, Douglas J. and Isella, Giovanni and Biagioni, Paolo and Ortolani, Michele} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/33196"> <dc:contributor>Paul, Douglas J.</dc:contributor> <dc:language>eng</dc:language> <dc:creator>Brida, Daniele</dc:creator> <dc:creator>Baldassarre, Leonetta</dc:creator> <dc:creator>Isella, Giovanni</dc:creator> <dcterms:title>Heavily phosphorous-doped Germanium thin films for mid-infrared plasmonics</dcterms:title> <dc:creator>Fischer, Marco</dc:creator> <dc:creator>Sakat, Emilie</dc:creator> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2016-03-02T11:20:42Z</dcterms:available> <dc:creator>Samarelli, Antonio</dc:creator> <dc:contributor>Samarelli, Antonio</dc:contributor> <dc:contributor>Biagioni, Paolo</dc:contributor> <dc:contributor>Baldassarre, Leonetta</dc:contributor> <dc:contributor>Brida, Daniele</dc:contributor> <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/33196"/> <dcterms:issued>2015-08</dcterms:issued> <dc:creator>Biagioni, Paolo</dc:creator> <dc:creator>Gallacher, Kevin</dc:creator> <dc:creator>Ortolani, Michele</dc:creator> <dc:contributor>Ortolani, Michele</dc:contributor> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2016-03-02T11:20:42Z</dc:date> <dc:contributor>Fischer, Marco</dc:contributor> <dc:creator>Frigerio, Jacopo</dc:creator> <dc:contributor>Frigerio, Jacopo</dc:contributor> <dc:contributor>Sakat, Emilie</dc:contributor> <dc:creator>Paul, Douglas J.</dc:creator> <dc:contributor>Isella, Giovanni</dc:contributor> <dcterms:abstract xml:lang="eng">Heavily doped Ge thin films grown on different substrates have been investigated by infrared (IR) reflectometry. Screened plasma frequency and losses have been determined to assess the possibilities and limitations of Ge for mid infrared plasmonic.</dcterms:abstract> <dc:contributor>Gallacher, Kevin</dc:contributor> </rdf:Description> </rdf:RDF>

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