Sub-Poissonian Shot Noise in Graphene

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dc.contributor.authorTworzydlo, Jakubdeu
dc.contributor.authorTrauzettel, Björndeu
dc.contributor.authorTitov, M.deu
dc.contributor.authorRycerz, Adamdeu
dc.contributor.authorBeenakker, Carlo W. J.deu
dc.date.accessioned2011-03-24T17:53:23Zdeu
dc.date.available2011-03-24T17:53:23Zdeu
dc.date.issued2006deu
dc.description.abstractWe calculate the mode-dependent transmission probability of massless Dirac fermions through an ideal strip of graphene (length L, width W, no impurities or defects) to obtain the conductance and shot noise as a function of Fermi energy.We find that the minimum conductivity of order e²=h at the Dirac point (when the electron and hole excitations are degenerate) is associated with a maximum of the Fano factor (the ratio of noise power and mean current). For short and wide graphene strips the Fano factor at the Dirac point equals 1=3, 3 times smaller than for a Poisson process. This is the same value as for a disordered metal, which is remarkable since the classical dynamics of the Dirac fermions is ballistic.eng
dc.description.versionpublished
dc.format.mimetypeapplication/pdfdeu
dc.identifier.citationFirst publ. in: Physical Review Letters, Vol. 96 (2006), Article 246802deu
dc.identifier.doi10.1103/PhysRevLett.96.246802
dc.identifier.ppn267142307deu
dc.identifier.urihttp://kops.uni-konstanz.de/handle/123456789/9076
dc.language.isoengdeu
dc.legacy.dateIssued2007deu
dc.rightsAttribution-NonCommercial-NoDerivs 2.0 Generic
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/
dc.subject.ddc530deu
dc.subject.pacs73.63.-bdeu
dc.subject.pacs73.23.Addeu
dc.subject.pacs73.50.Tddeu
dc.titleSub-Poissonian Shot Noise in Grapheneeng
dc.typeJOURNAL_ARTICLEdeu
dspace.entity.typePublication
kops.citation.bibtex
@article{Tworzydlo2006SubPo-9076,
  year={2006},
  doi={10.1103/PhysRevLett.96.246802},
  title={Sub-Poissonian Shot Noise in Graphene},
  number={24},
  volume={96},
  issn={0031-9007},
  journal={Physical Review Letters},
  author={Tworzydlo, Jakub and Trauzettel, Björn and Titov, M. and Rycerz, Adam and Beenakker, Carlo W. J.},
  note={Article Number: 246802}
}
kops.citation.iso690TWORZYDLO, Jakub, Björn TRAUZETTEL, M. TITOV, Adam RYCERZ, Carlo W. J. BEENAKKER, 2006. Sub-Poissonian Shot Noise in Graphene. In: Physical Review Letters. 2006, 96(24), 246802. ISSN 0031-9007. eISSN 1079-7114. Available under: doi: 10.1103/PhysRevLett.96.246802deu
kops.citation.iso690TWORZYDLO, Jakub, Björn TRAUZETTEL, M. TITOV, Adam RYCERZ, Carlo W. J. BEENAKKER, 2006. Sub-Poissonian Shot Noise in Graphene. In: Physical Review Letters. 2006, 96(24), 246802. ISSN 0031-9007. eISSN 1079-7114. Available under: doi: 10.1103/PhysRevLett.96.246802eng
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kops.sourcefieldPhysical Review Letters. 2006, <b>96</b>(24), 246802. ISSN 0031-9007. eISSN 1079-7114. Available under: doi: 10.1103/PhysRevLett.96.246802deu
kops.sourcefield.plainPhysical Review Letters. 2006, 96(24), 246802. ISSN 0031-9007. eISSN 1079-7114. Available under: doi: 10.1103/PhysRevLett.96.246802deu
kops.sourcefield.plainPhysical Review Letters. 2006, 96(24), 246802. ISSN 0031-9007. eISSN 1079-7114. Available under: doi: 10.1103/PhysRevLett.96.246802eng
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source.bibliographicInfo.issue24
source.bibliographicInfo.volume96
source.identifier.eissn1079-7114
source.identifier.issn0031-9007
source.periodicalTitlePhysical Review Letters

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