Influence of emitter layers on LeTID kinetics in multicrystalline silicon

Kurzanzeige
dc.contributor.authorOtaegi, Alona
dc.contributor.authorSkorka, Daniel
dc.contributor.authorSchmid, Andreas
dc.contributor.authorZuschlag, Annika
dc.contributor.authorJimeno, Juan Carlos
dc.contributor.authorHahn, Giso
dc.date.accessioned2019-02-25T12:40:32Z
dc.date.available2019-02-25T12:40:32Z
dc.date.issued2018eng
dc.description.abstractThe influence of emitter layers on LeTID kinetics in multicrystalline silicon is analysed in this work. Multicrystalline silicon samples with emitter layers with sheet resistivity of 60, 175, 200, 230 and 360 Ω/sq have been processed and exposed afterwards to 1 sun illumination at 75ºC for more than 2000 h. The effective lifetime of the minority charge carriers of the samples has been measured repetitively by spatially resolved photoluminescence. The resulting lifetime maps are analysed and the effective defect concentration of the samples is calculated. This approach leads to different degradation rates, depending on the emitter sheet resistivity, and to the same defect regeneration rate, but differing in the onset of regeneration.eng
dc.description.versionpublishedeng
dc.identifier.ppn518184145
dc.identifier.urihttps://kops.uni-konstanz.de/handle/123456789/45200
dc.language.isoengeng
dc.rightsterms-of-use
dc.rights.urihttps://rightsstatements.org/page/InC/1.0/
dc.subjectDegradation, Regeneration, Emitter, Layers, Multicrystalline Silicon, LeTIDeng
dc.subject.ddc530eng
dc.titleInfluence of emitter layers on LeTID kinetics in multicrystalline siliconeng
dc.typeINPROCEEDINGSeng
dspace.entity.typePublication
kops.citation.bibtex
@inproceedings{Otaegi2018Influ-45200,
  year={2018},
  title={Influence of emitter layers on LeTID kinetics in multicrystalline silicon},
  url={https://www.eupvsec-planner.com/presentations/c45789/influence_of_emitter_layers_on_letid_kinetics_in_multicrystalline_silicon.htm},
  isbn={978-3-936338-50-8},
  publisher={WIP},
  address={München},
  booktitle={35th European Photovoltaic Solar Energy Conference and Exhibition},
  pages={293--297},
  editor={Verlinden, Pierre},
  author={Otaegi, Alona and Skorka, Daniel and Schmid, Andreas and Zuschlag, Annika and Jimeno, Juan Carlos and Hahn, Giso}
}
kops.citation.iso690OTAEGI, Alona, Daniel SKORKA, Andreas SCHMID, Annika ZUSCHLAG, Juan Carlos JIMENO, Giso HAHN, 2018. Influence of emitter layers on LeTID kinetics in multicrystalline silicon. 35th European Photovoltaic Solar Energy Conference and Exhibition. Brussels, 24. Sept. 2018 - 28. Sept. 2018. In: VERLINDEN, Pierre, ed. and others. 35th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP, 2018, pp. 293-297. ISBN 978-3-936338-50-8deu
kops.citation.iso690OTAEGI, Alona, Daniel SKORKA, Andreas SCHMID, Annika ZUSCHLAG, Juan Carlos JIMENO, Giso HAHN, 2018. Influence of emitter layers on LeTID kinetics in multicrystalline silicon. 35th European Photovoltaic Solar Energy Conference and Exhibition. Brussels, Sep 24, 2018 - Sep 28, 2018. In: VERLINDEN, Pierre, ed. and others. 35th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP, 2018, pp. 293-297. ISBN 978-3-936338-50-8eng
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kops.conferencefield35th European Photovoltaic Solar Energy Conference and Exhibition, 24. Sept. 2018 - 28. Sept. 2018, Brusselsdeu
kops.date.conferenceEnd2018-09-28eng
kops.date.conferenceStart2018-09-24eng
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kops.sourcefieldVERLINDEN, Pierre, ed. and others. <i>35th European Photovoltaic Solar Energy Conference and Exhibition</i>. München: WIP, 2018, pp. 293-297. ISBN 978-3-936338-50-8deu
kops.sourcefield.plainVERLINDEN, Pierre, ed. and others. 35th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP, 2018, pp. 293-297. ISBN 978-3-936338-50-8deu
kops.sourcefield.plainVERLINDEN, Pierre, ed. and others. 35th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP, 2018, pp. 293-297. ISBN 978-3-936338-50-8eng
kops.title.conference35th European Photovoltaic Solar Energy Conference and Exhibitioneng
kops.urlhttps://www.eupvsec-planner.com/presentations/c45789/influence_of_emitter_layers_on_letid_kinetics_in_multicrystalline_silicon.htmeng
kops.urlDate2019-02-16eng
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source.contributor.editorVerlinden, Pierre
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source.publisherWIPeng
source.publisher.locationMüncheneng
source.title35th European Photovoltaic Solar Energy Conference and Exhibitioneng

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