Influence of dielectric layers and thermal load on LeTID

Kurzanzeige
dc.contributor.authorWinter, Clemens
dc.contributor.authorZuschlag, Annika
dc.contributor.authorSkorka, Daniel
dc.contributor.authorHahn, Giso
dc.date.accessioned2018-11-05T10:23:03Z
dc.date.available2018-11-05T10:23:03Z
dc.date.issued2018eng
dc.description.abstractLight and elevated temperature induced degradation (LeTID) is observed for multicrystalline (mc) Si passivated emitter and rear cell (PERC) solar cells, strongly limiting solar cell parameters under operation conditions. In this contribution, we investigate the effect of surface passivation layer being present during the firing step based on lifetime samples. The LeTID effect is only observed if the surface passivation layer is present during the firing step. Samples without firing step show no LeTID. A re-passivation of the surface significantly changes the LeTID effect, showing that the whole sample treatment, temperature load and hydrogen content of a sample has to be taken into account investigating and evaluating LeTID.eng
dc.description.versionpublishedeng
dc.identifier.doi10.1063/1.5049339eng
dc.identifier.ppn512635595
dc.identifier.urihttps://kops.uni-konstanz.de/handle/123456789/43642
dc.language.isoengeng
dc.rightsterms-of-use
dc.rights.urihttps://rightsstatements.org/page/InC/1.0/
dc.subject.ddc530eng
dc.titleInfluence of dielectric layers and thermal load on LeTIDeng
dc.typeINPROCEEDINGSeng
dspace.entity.typePublication
kops.citation.bibtex
@inproceedings{Winter2018Influ-43642,
  year={2018},
  doi={10.1063/1.5049339},
  title={Influence of dielectric layers and thermal load on LeTID},
  number={1999,1},
  isbn={978-0-7354-1715-1},
  issn={0094-243X},
  publisher={AIP Publishing},
  address={Melville, NY},
  series={AIP Conference Proceedings},
  booktitle={SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics},
  editor={Ballif, Christophe},
  author={Winter, Clemens and Zuschlag, Annika and Skorka, Daniel and Hahn, Giso},
  note={Article Number: 130020}
}
kops.citation.iso690WINTER, Clemens, Annika ZUSCHLAG, Daniel SKORKA, Giso HAHN, 2018. Influence of dielectric layers and thermal load on LeTID. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Lausanne, 19. März 2018 - 21. März 2018. In: BALLIF, Christophe, ed. and others. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Melville, NY: AIP Publishing, 2018, 130020. AIP Conference Proceedings. 1999,1. ISSN 0094-243X. eISSN 1551-7616. ISBN 978-0-7354-1715-1. Available under: doi: 10.1063/1.5049339deu
kops.citation.iso690WINTER, Clemens, Annika ZUSCHLAG, Daniel SKORKA, Giso HAHN, 2018. Influence of dielectric layers and thermal load on LeTID. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Lausanne, Mar 19, 2018 - Mar 21, 2018. In: BALLIF, Christophe, ed. and others. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Melville, NY: AIP Publishing, 2018, 130020. AIP Conference Proceedings. 1999,1. ISSN 0094-243X. eISSN 1551-7616. ISBN 978-0-7354-1715-1. Available under: doi: 10.1063/1.5049339eng
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kops.sourcefield.plainBALLIF, Christophe, ed. and others. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Melville, NY: AIP Publishing, 2018, 130020. AIP Conference Proceedings. 1999,1. ISSN 0094-243X. eISSN 1551-7616. ISBN 978-0-7354-1715-1. Available under: doi: 10.1063/1.5049339deu
kops.sourcefield.plainBALLIF, Christophe, ed. and others. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Melville, NY: AIP Publishing, 2018, 130020. AIP Conference Proceedings. 1999,1. ISSN 0094-243X. eISSN 1551-7616. ISBN 978-0-7354-1715-1. Available under: doi: 10.1063/1.5049339eng
kops.title.conferenceSiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaicseng
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source.titleSiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaicseng

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