Publikation:

Influence of dielectric layers and thermal load on LeTID

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2018

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http://nbn-resolving.de/urn:nbn:de:bsz:352-2-1mvrpzptqwcfd0
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https://doi.org/10.1063/1.5049339
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BALLIF, Christophe, ed. and others. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Melville, NY: AIP Publishing, 2018, 130020. AIP Conference Proceedings. 1999,1. ISSN 0094-243X. eISSN 1551-7616. ISBN 978-0-7354-1715-1. Available under: doi: 10.1063/1.5049339

Zusammenfassung

Light and elevated temperature induced degradation (LeTID) is observed for multicrystalline (mc) Si passivated emitter and rear cell (PERC) solar cells, strongly limiting solar cell parameters under operation conditions. In this contribution, we investigate the effect of surface passivation layer being present during the firing step based on lifetime samples. The LeTID effect is only observed if the surface passivation layer is present during the firing step. Samples without firing step show no LeTID. A re-passivation of the surface significantly changes the LeTID effect, showing that the whole sample treatment, temperature load and hydrogen content of a sample has to be taken into account investigating and evaluating LeTID.

Zusammenfassung in einer weiteren Sprache

Fachgebiet (DDC)
530 Physik

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SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics, 19. März 2018 - 21. März 2018, Lausanne
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ISO 690WINTER, Clemens, Annika ZUSCHLAG, Daniel SKORKA, Giso HAHN, 2018. Influence of dielectric layers and thermal load on LeTID. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Lausanne, 19. März 2018 - 21. März 2018. In: BALLIF, Christophe, ed. and others. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Melville, NY: AIP Publishing, 2018, 130020. AIP Conference Proceedings. 1999,1. ISSN 0094-243X. eISSN 1551-7616. ISBN 978-0-7354-1715-1. Available under: doi: 10.1063/1.5049339
BibTex
@inproceedings{Winter2018Influ-43642,
  year={2018},
  doi={10.1063/1.5049339},
  title={Influence of dielectric layers and thermal load on LeTID},
  number={1999,1},
  isbn={978-0-7354-1715-1},
  issn={0094-243X},
  publisher={AIP Publishing},
  address={Melville, NY},
  series={AIP Conference Proceedings},
  booktitle={SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics},
  editor={Ballif, Christophe},
  author={Winter, Clemens and Zuschlag, Annika and Skorka, Daniel and Hahn, Giso},
  note={Article Number: 130020}
}
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