Fast illuminated lock-in thermography : an inline shunt detection measurement tool
| dc.contributor.author | Seren, Sven | |
| dc.contributor.author | Hahn, Giso | |
| dc.contributor.author | Demberger, Carsten | deu |
| dc.contributor.author | Nagel, H. | deu |
| dc.date.accessioned | 2011-03-22T17:52:39Z | deu |
| dc.date.available | 2011-03-22T17:52:39Z | deu |
| dc.date.issued | 2008 | deu |
| dc.description.abstract | This paper focuses on the fast spatially resolved detection of material and / or processing induced shunting using fast illuminated Lock-In Thermography (iLIT). With this technique shunting can be detected spatially resolved within a measurement time of only 1 s and thus the method in principle can be used for inline characterisation. Points addressed are the influence of Lock-In frequency on spatial resolution and the effect of a lowered illumination intensity for a better selectivity between shunting and recombination induced generation of heat. The method is tested for different common sources of shunting in standard industrial-type solar cells (points like shunts, cracks, poor edge isolation, contaminations) and all major types of shunts under investigation can be detected in times relevant for inline characterisation. | eng |
| dc.description.version | published | |
| dc.identifier.citation | Publ. in: Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, San Diego 2008. US: Institute of Electrical and Electronics Engineers, 2008 | deu |
| dc.identifier.ppn | 508218802 | |
| dc.identifier.uri | http://kops.uni-konstanz.de/handle/123456789/987 | |
| dc.language.iso | eng | deu |
| dc.legacy.dateIssued | 2010 | deu |
| dc.rights | terms-of-use | |
| dc.rights.uri | https://rightsstatements.org/page/InC/1.0/ | |
| dc.subject.ddc | 530 | deu |
| dc.title | Fast illuminated lock-in thermography : an inline shunt detection measurement tool | eng |
| dc.type | INPROCEEDINGS | deu |
| dspace.entity.type | Publication | |
| kops.citation.bibtex | @inproceedings{Seren2008illum-987,
year={2008},
title={Fast illuminated lock-in thermography : an inline shunt detection measurement tool},
isbn={978-1-4244-1640-0},
publisher={IEEE},
address={Piscataway, NJ},
booktitle={33rd IEEE Photovoltaic Specialists Conference, 2008 : PVSC '08 ; 11 - 16 May 2008, San Diego, California},
author={Seren, Sven and Hahn, Giso and Demberger, Carsten and Nagel, H.}
} | |
| kops.citation.iso690 | SEREN, Sven, Giso HAHN, Carsten DEMBERGER, H. NAGEL, 2008. Fast illuminated lock-in thermography : an inline shunt detection measurement tool. In: 33rd IEEE Photovoltaic Specialists Conference, 2008 : PVSC '08 ; 11 - 16 May 2008, San Diego, California. Piscataway, NJ: IEEE, 2008. ISBN 978-1-4244-1640-0 | deu |
| kops.citation.iso690 | SEREN, Sven, Giso HAHN, Carsten DEMBERGER, H. NAGEL, 2008. Fast illuminated lock-in thermography : an inline shunt detection measurement tool. In: 33rd IEEE Photovoltaic Specialists Conference, 2008 : PVSC '08 ; 11 - 16 May 2008, San Diego, California. Piscataway, NJ: IEEE, 2008. ISBN 978-1-4244-1640-0 | eng |
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| source.title | 33rd IEEE Photovoltaic Specialists Conference, 2008 : PVSC '08 ; 11 - 16 May 2008, San Diego, California |
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