Publikation: Fast illuminated lock-in thermography : an inline shunt detection measurement tool
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33rd IEEE Photovoltaic Specialists Conference, 2008 : PVSC '08 ; 11 - 16 May 2008, San Diego, California. Piscataway, NJ: IEEE, 2008. ISBN 978-1-4244-1640-0
Zusammenfassung
This paper focuses on the fast spatially resolved detection of material and / or processing induced shunting using fast illuminated Lock-In Thermography (iLIT). With this technique shunting can be detected spatially resolved within a measurement time of only 1 s and thus the method in principle can be used for inline characterisation. Points addressed are the influence of Lock-In frequency on spatial resolution and the effect of a lowered illumination intensity for a better selectivity between shunting and recombination induced generation of heat. The method is tested for different common sources of shunting in standard industrial-type solar cells (points like shunts, cracks, poor edge isolation, contaminations) and all major types of shunts under investigation can be detected in times relevant for inline characterisation.
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SEREN, Sven, Giso HAHN, Carsten DEMBERGER, H. NAGEL, 2008. Fast illuminated lock-in thermography : an inline shunt detection measurement tool. In: 33rd IEEE Photovoltaic Specialists Conference, 2008 : PVSC '08 ; 11 - 16 May 2008, San Diego, California. Piscataway, NJ: IEEE, 2008. ISBN 978-1-4244-1640-0BibTex
@inproceedings{Seren2008illum-987,
year={2008},
title={Fast illuminated lock-in thermography : an inline shunt detection measurement tool},
isbn={978-1-4244-1640-0},
publisher={IEEE},
address={Piscataway, NJ},
booktitle={33rd IEEE Photovoltaic Specialists Conference, 2008 : PVSC '08 ; 11 - 16 May 2008, San Diego, California},
author={Seren, Sven and Hahn, Giso and Demberger, Carsten and Nagel, H.}
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