High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films

Albrecht, Uwe; Dilger, Herbert; Evers, Peter; Leiderer, Paul

High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films

Dateien

098_procspie_1991.pdfGröße: 466.1 KBDownloads: 212

Datum

1991

Autor:innen

Albrecht, Uwe

Dilger, Herbert

Evers, Peter

Leiderer, Paul

URI (zitierfähiger Link)

http://nbn-resolving.de/urn:nbn:de:bsz:352-opus-31090

Link zur Lizenz

Attribution-NonCommercial-NoDerivs 2.0 Generic

Open Access-Veröffentlichung

Open Access Green

Sammlungen

Physik

Publikationstyp

Beitrag zu einem Konferenzband

Publikationsstatus

Published

Erschienen in

Process Module Metrology, Control and Clustering, Proceedings of SPIE. 1991, pp. 344-351

Zusammenfassung

We describe the use of optically excited surface plasmons to measure the thickness of ultrathin films deposited on gold and silver surfaces with submonolayer resolution. Additional structural information on the film is obtained by looking at the scattering of the surface plasmons. Applications of this method to physisorbed and quench-condensed molecular hydrogen films and to spreading of liquids are presented.

Fachgebiet (DDC)

530 Physik

Zitieren

ISO 690

ALBRECHT, Uwe, Herbert DILGER, Peter EVERS, Paul LEIDERER, 1991. High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films. In: Process Module Metrology, Control and Clustering, Proceedings of SPIE. 1991, pp. 344-351

BibTex

@inproceedings{Albrecht1991resol-9066,
  year={1991},
  title={High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films},
  booktitle={Process Module Metrology, Control and Clustering, Proceedings of SPIE},
  pages={344--351},
  author={Albrecht, Uwe and Dilger, Herbert and Evers, Peter and Leiderer, Paul}
}

RDF

<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/9066">
    <dc:creator>Leiderer, Paul</dc:creator>
    <dc:contributor>Leiderer, Paul</dc:contributor>
    <dcterms:rights rdf:resource="http://creativecommons.org/licenses/by-nc-nd/2.0/"/>
    <dcterms:issued>1991</dcterms:issued>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:53:18Z</dc:date>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:53:18Z</dcterms:available>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9066/1/098_procspie_1991.pdf"/>
    <dc:rights>Attribution-NonCommercial-NoDerivs 2.0 Generic</dc:rights>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:language>eng</dc:language>
    <dc:format>application/pdf</dc:format>
    <dc:creator>Dilger, Herbert</dc:creator>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:contributor>Evers, Peter</dc:contributor>
    <dc:contributor>Dilger, Herbert</dc:contributor>
    <dc:contributor>Albrecht, Uwe</dc:contributor>
    <dcterms:title>High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films</dcterms:title>
    <dcterms:bibliographicCitation>First publ. in: Process Module Metrology, Control and Clustering, Proceedings of SPIE, Vol. 1594 (1991), pp. 344-351</dcterms:bibliographicCitation>
    <dc:creator>Albrecht, Uwe</dc:creator>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/9066"/>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dcterms:abstract xml:lang="eng">We describe the use of optically excited surface plasmons to measure the thickness of ultrathin films deposited on gold and silver surfaces with submonolayer resolution. Additional structural information on the film is obtained by looking at the scattering of the surface plasmons. Applications of this method to physisorbed and quench-condensed molecular hydrogen films and to spreading of liquids are presented.</dcterms:abstract>
    <dc:creator>Evers, Peter</dc:creator>
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/9066/1/098_procspie_1991.pdf"/>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
  </rdf:Description>
</rdf:RDF>

Universitätsbibliographie

Nein