High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films

Kurzanzeige
dc.contributor.authorAlbrecht, Uwedeu
dc.contributor.authorDilger, Herbertdeu
dc.contributor.authorEvers, Peterdeu
dc.contributor.authorLeiderer, Paul
dc.date.accessioned2011-03-24T17:53:18Zdeu
dc.date.available2011-03-24T17:53:18Zdeu
dc.date.issued1991deu
dc.description.abstractWe describe the use of optically excited surface plasmons to measure the thickness of ultrathin films deposited on gold and silver surfaces with submonolayer resolution. Additional structural information on the film is obtained by looking at the scattering of the surface plasmons. Applications of this method to physisorbed and quench-condensed molecular hydrogen films and to spreading of liquids are presented.eng
dc.description.versionpublished
dc.format.mimetypeapplication/pdfdeu
dc.identifier.citationFirst publ. in: Process Module Metrology, Control and Clustering, Proceedings of SPIE, Vol. 1594 (1991), pp. 344-351deu
dc.identifier.ppn26608771Xdeu
dc.identifier.urihttp://kops.uni-konstanz.de/handle/123456789/9066
dc.language.isoengdeu
dc.legacy.dateIssued2007deu
dc.rightsAttribution-NonCommercial-NoDerivs 2.0 Generic
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/
dc.subject.ddc530deu
dc.titleHigh resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin filmseng
dc.typeINPROCEEDINGSdeu
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kops.citation.bibtex
@inproceedings{Albrecht1991resol-9066,
  year={1991},
  title={High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films},
  booktitle={Process Module Metrology, Control and Clustering, Proceedings of SPIE},
  pages={344--351},
  author={Albrecht, Uwe and Dilger, Herbert and Evers, Peter and Leiderer, Paul}
}
kops.citation.iso690ALBRECHT, Uwe, Herbert DILGER, Peter EVERS, Paul LEIDERER, 1991. High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films. In: Process Module Metrology, Control and Clustering, Proceedings of SPIE. 1991, pp. 344-351deu
kops.citation.iso690ALBRECHT, Uwe, Herbert DILGER, Peter EVERS, Paul LEIDERER, 1991. High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films. In: Process Module Metrology, Control and Clustering, Proceedings of SPIE. 1991, pp. 344-351eng
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kops.sourcefield.plainProcess Module Metrology, Control and Clustering, Proceedings of SPIE. 1991, pp. 344-351deu
kops.sourcefield.plainProcess Module Metrology, Control and Clustering, Proceedings of SPIE. 1991, pp. 344-351eng
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