Single-particle evanescent light scattering simulations for total internal reflection microscopy

Kurzanzeige
dc.contributor.authorHelden, Laurent
dc.contributor.authorEremina, Elena
dc.contributor.authorRiefler, Norbert
dc.contributor.authorHertlein, Christopher
dc.contributor.authorBechinger, Clemens
dc.contributor.authorEremin, Yuri
dc.contributor.authorWriedt, Thomas
dc.date.accessioned2017-06-12T14:52:12Z
dc.date.available2017-06-12T14:52:12Z
dc.date.issued2006-10-01eng
dc.description.abstractWe simulate and measure light scattering of a micrometer-sized spherical particle suspended in solution close to a glass substrate. The model, based on the discrete sources method, is developed to describe the experimental situation of total internal reflection microscopy experiments; i.e., the particle is illuminated by an evanescent light field originating from the glass–solvent interface. In contrast to the well-established assumption of a simple exponential decay of the scattering intensity with distance, we demonstrate significant deviations for a certain range of penetration depths and polarization states of the incident light.eng
dc.description.versionpublishedde
dc.identifier.doi10.1364/AO.45.007299eng
dc.identifier.ppn489872069
dc.identifier.urihttps://kops.uni-konstanz.de/handle/123456789/39212
dc.language.isoengeng
dc.rightsterms-of-use
dc.rights.urihttps://rightsstatements.org/page/InC/1.0/
dc.subject.ddc530eng
dc.titleSingle-particle evanescent light scattering simulations for total internal reflection microscopyeng
dc.typeJOURNAL_ARTICLEde
dspace.entity.typePublication
kops.citation.bibtex
@article{Helden2006-10-01Singl-39212,
  year={2006},
  doi={10.1364/AO.45.007299},
  title={Single-particle evanescent light scattering simulations for total internal reflection microscopy},
  number={28},
  volume={45},
  issn={0003-6935},
  journal={Applied Optics},
  pages={7299--7308},
  author={Helden, Laurent and Eremina, Elena and Riefler, Norbert and Hertlein, Christopher and Bechinger, Clemens and Eremin, Yuri and Wriedt, Thomas}
}
kops.citation.iso690HELDEN, Laurent, Elena EREMINA, Norbert RIEFLER, Christopher HERTLEIN, Clemens BECHINGER, Yuri EREMIN, Thomas WRIEDT, 2006. Single-particle evanescent light scattering simulations for total internal reflection microscopy. In: Applied Optics. 2006, 45(28), pp. 7299-7308. ISSN 0003-6935. eISSN 1539-4522. Available under: doi: 10.1364/AO.45.007299deu
kops.citation.iso690HELDEN, Laurent, Elena EREMINA, Norbert RIEFLER, Christopher HERTLEIN, Clemens BECHINGER, Yuri EREMIN, Thomas WRIEDT, 2006. Single-particle evanescent light scattering simulations for total internal reflection microscopy. In: Applied Optics. 2006, 45(28), pp. 7299-7308. ISSN 0003-6935. eISSN 1539-4522. Available under: doi: 10.1364/AO.45.007299eng
kops.citation.rdf
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/39212">
    <dc:creator>Bechinger, Clemens</dc:creator>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:creator>Riefler, Norbert</dc:creator>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/39212/1/Helden_0-410596.pdf"/>
    <dc:contributor>Eremin, Yuri</dc:contributor>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2017-06-12T14:52:12Z</dcterms:available>
    <dc:contributor>Eremina, Elena</dc:contributor>
    <dc:contributor>Bechinger, Clemens</dc:contributor>
    <dcterms:issued>2006-10-01</dcterms:issued>
    <dc:rights>terms-of-use</dc:rights>
    <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/39212"/>
    <dc:contributor>Riefler, Norbert</dc:contributor>
    <dc:contributor>Wriedt, Thomas</dc:contributor>
    <dcterms:abstract xml:lang="eng">We simulate and measure light scattering of a micrometer-sized spherical particle suspended in solution close to a glass substrate. The model, based on the discrete sources method, is developed to describe the experimental situation of total internal reflection microscopy experiments; i.e., the particle is illuminated by an evanescent light field originating from the glass–solvent interface. In contrast to the well-established assumption of a simple exponential decay of the scattering intensity with distance, we demonstrate significant deviations for a certain range of penetration depths and polarization states of the incident light.</dcterms:abstract>
    <dc:creator>Eremina, Elena</dc:creator>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2017-06-12T14:52:12Z</dc:date>
    <dcterms:title>Single-particle evanescent light scattering simulations for total internal reflection microscopy</dcterms:title>
    <dc:creator>Hertlein, Christopher</dc:creator>
    <dc:creator>Eremin, Yuri</dc:creator>
    <dc:creator>Helden, Laurent</dc:creator>
    <dc:contributor>Helden, Laurent</dc:contributor>
    <dc:creator>Wriedt, Thomas</dc:creator>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/39212/1/Helden_0-410596.pdf"/>
    <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
    <dc:language>eng</dc:language>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:contributor>Hertlein, Christopher</dc:contributor>
  </rdf:Description>
</rdf:RDF>
kops.description.openAccessopenaccessgreen
kops.flag.knbibliographyfalse
kops.identifier.nbnurn:nbn:de:bsz:352-0-410596
kops.sourcefieldApplied Optics. 2006, <b>45</b>(28), pp. 7299-7308. ISSN 0003-6935. eISSN 1539-4522. Available under: doi: 10.1364/AO.45.007299deu
kops.sourcefield.plainApplied Optics. 2006, 45(28), pp. 7299-7308. ISSN 0003-6935. eISSN 1539-4522. Available under: doi: 10.1364/AO.45.007299deu
kops.sourcefield.plainApplied Optics. 2006, 45(28), pp. 7299-7308. ISSN 0003-6935. eISSN 1539-4522. Available under: doi: 10.1364/AO.45.007299eng
relation.isAuthorOfPublication37778d1a-fdea-43ea-ae7d-92b6a9985710
relation.isAuthorOfPublication.latestForDiscovery37778d1a-fdea-43ea-ae7d-92b6a9985710
source.bibliographicInfo.fromPage7299eng
source.bibliographicInfo.issue28eng
source.bibliographicInfo.toPage7308eng
source.bibliographicInfo.volume45eng
source.identifier.eissn1539-4522eng
source.identifier.issn0003-6935eng
source.periodicalTitleApplied Opticseng

Dateien

Originalbündel

Gerade angezeigt 1 - 1 von 1
Vorschaubild nicht verfügbar
Name:
Helden_0-410596.pdf
Größe:
151.77 KB
Format:
Adobe Portable Document Format
Beschreibung:
Helden_0-410596.pdf
Helden_0-410596.pdfGröße: 151.77 KBDownloads: 422

Sammlungen

Physik: Publikationen