Publikation: Single-particle evanescent light scattering simulations for total internal reflection microscopy
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2006
Autor:innen
Helden, Laurent
Eremina, Elena
Riefler, Norbert
Hertlein, Christopher
Eremin, Yuri
Wriedt, Thomas
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Applied Optics. 2006, 45(28), pp. 7299-7308. ISSN 0003-6935. eISSN 1539-4522. Available under: doi: 10.1364/AO.45.007299
Zusammenfassung
We simulate and measure light scattering of a micrometer-sized spherical particle suspended in solution close to a glass substrate. The model, based on the discrete sources method, is developed to describe the experimental situation of total internal reflection microscopy experiments; i.e., the particle is illuminated by an evanescent light field originating from the glass–solvent interface. In contrast to the well-established assumption of a simple exponential decay of the scattering intensity with distance, we demonstrate significant deviations for a certain range of penetration depths and polarization states of the incident light.
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530 Physik
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HELDEN, Laurent, Elena EREMINA, Norbert RIEFLER, Christopher HERTLEIN, Clemens BECHINGER, Yuri EREMIN, Thomas WRIEDT, 2006. Single-particle evanescent light scattering simulations for total internal reflection microscopy. In: Applied Optics. 2006, 45(28), pp. 7299-7308. ISSN 0003-6935. eISSN 1539-4522. Available under: doi: 10.1364/AO.45.007299BibTex
@article{Helden2006-10-01Singl-39212,
year={2006},
doi={10.1364/AO.45.007299},
title={Single-particle evanescent light scattering simulations for total internal reflection microscopy},
number={28},
volume={45},
issn={0003-6935},
journal={Applied Optics},
pages={7299--7308},
author={Helden, Laurent and Eremina, Elena and Riefler, Norbert and Hertlein, Christopher and Bechinger, Clemens and Eremin, Yuri and Wriedt, Thomas}
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