Visualizing frequent patterns in large multivariate time series

dc.contributor.authorHao, Mingdeu
dc.contributor.authorMarwah, Manishdeu
dc.contributor.authorJanetzko, Halldor
dc.contributor.authorSharma, Ratneshdeu
dc.contributor.authorKeim, Daniel A.
dc.contributor.authorDayal, Umeshwardeu
dc.contributor.authorPatnaik, Debprakashdeu
dc.contributor.authorRamakrishnan, Narendeu
dc.date.accessioned2012-06-28T09:45:49Zdeu
dc.date.available2012-06-28T09:45:49Zdeu
dc.date.issued2011-01-24
dc.description.abstractThe detection of previously unknown, frequently occurring patterns in time series, often called motifs, has been recognized as an important task. However, it is difficult to discover and visualize these motifs as their numbers increase, especially in large multivariate time series. To find frequent motifs, we use several temporal data mining and event encoding techniques to cluster and convert a multivariate time series to a sequence of events. Then we quantify the efficiency of the discovered motifs by linking them with a performance metric. To visualize frequent patterns in a large time series with potentially hundreds of nested motifs on a single display, we introduce three novel visual analytics methods: (1) motif layout, using colored rectangles for visualizing the occurrences and hierarchical relationships of motifs in a multivariate time series, (2) motif distortion, for enlarging or shrinking motifs as appropriate for easy analysis and (3) motif merging, to combine a number of identical adjacent motif instances without cluttering the display. Analysts can interactively optimize the degree of distortion and merging to get the best possible view. A specific motif (e.g., the most efficient or least efficient motif) can be quickly detected from a large time series for further investigation. We have applied these methods to two real-world data sets: data center cooling and oil well production. The results provide important new insights into the recurring patterns.eng
dc.description.versionpublished
dc.identifier.citationPubl. in: Visualization and data analysis 2011 : 24 - 25 January 2011, California, United States ; [part of] IS&T/SPIE electronic imaging, science and technology / Pak Chung Wong ... (Eds). - Bellingham, Wash. : SPIE, 2011. - 78680J [17]. - (Proceedings of SPIE ; 7868). - ISBN 978-0-8194-8405-5deu
dc.identifier.doi10.1117/12.872169deu
dc.identifier.urihttp://kops.uni-konstanz.de/handle/123456789/19392
dc.language.isoengdeu
dc.legacy.dateIssued2012-06-28deu
dc.rightsterms-of-usedeu
dc.rights.urihttps://rightsstatements.org/page/InC/1.0/deu
dc.subject.ddc004deu
dc.titleVisualizing frequent patterns in large multivariate time serieseng
dc.typeINPROCEEDINGSdeu
dspace.entity.typePublication
kops.citation.bibtex
@inproceedings{Hao2011-01-24Visua-19392,
  year={2011},
  doi={10.1117/12.872169},
  title={Visualizing frequent patterns in large multivariate time series},
  number={7868},
  publisher={SPIE},
  series={SPIE Proceedings},
  booktitle={Visualization and Data Analysis 2011},
  pages={78680J--78680J-10},
  editor={Wong, Pak Chung},
  author={Hao, Ming and Marwah, Manish and Janetzko, Halldor and Sharma, Ratnesh and Keim, Daniel A. and Dayal, Umeshwar and Patnaik, Debprakash and Ramakrishnan, Naren}
}
kops.citation.iso690HAO, Ming, Manish MARWAH, Halldor JANETZKO, Ratnesh SHARMA, Daniel A. KEIM, Umeshwar DAYAL, Debprakash PATNAIK, Naren RAMAKRISHNAN, 2011. Visualizing frequent patterns in large multivariate time series. IS&T/SPIE Electronic Imaging. San Francisco, California. In: WONG, Pak Chung, ed. and others. Visualization and Data Analysis 2011. SPIE, 2011, pp. 78680J-78680J-10. SPIE Proceedings. 7868. Available under: doi: 10.1117/12.872169deu
kops.citation.iso690HAO, Ming, Manish MARWAH, Halldor JANETZKO, Ratnesh SHARMA, Daniel A. KEIM, Umeshwar DAYAL, Debprakash PATNAIK, Naren RAMAKRISHNAN, 2011. Visualizing frequent patterns in large multivariate time series. IS&T/SPIE Electronic Imaging. San Francisco, California. In: WONG, Pak Chung, ed. and others. Visualization and Data Analysis 2011. SPIE, 2011, pp. 78680J-78680J-10. SPIE Proceedings. 7868. Available under: doi: 10.1117/12.872169eng
kops.citation.rdf
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/19392">
    <dcterms:issued>2011-01-24</dcterms:issued>
    <dc:contributor>Patnaik, Debprakash</dc:contributor>
    <dc:contributor>Janetzko, Halldor</dc:contributor>
    <dc:contributor>Ramakrishnan, Naren</dc:contributor>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/36"/>
    <dc:contributor>Keim, Daniel A.</dc:contributor>
    <dcterms:title>Visualizing frequent patterns in large multivariate time series</dcterms:title>
    <dc:contributor>Marwah, Manish</dc:contributor>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2012-06-28T09:45:49Z</dcterms:available>
    <dc:creator>Patnaik, Debprakash</dc:creator>
    <dc:creator>Janetzko, Halldor</dc:creator>
    <dc:creator>Hao, Ming</dc:creator>
    <dc:language>eng</dc:language>
    <dc:contributor>Hao, Ming</dc:contributor>
    <dc:creator>Marwah, Manish</dc:creator>
    <dcterms:bibliographicCitation>Publ. in: Visualization and data analysis 2011 : 24 - 25 January 2011, California, United States ; [part of] IS&amp;T/SPIE electronic imaging, science and technology / Pak Chung Wong ... (Eds). - Bellingham, Wash. : SPIE, 2011. - 78680J [17]. - (Proceedings of SPIE ; 7868). - ISBN 978-0-8194-8405-5</dcterms:bibliographicCitation>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/19392"/>
    <dc:creator>Keim, Daniel A.</dc:creator>
    <dc:contributor>Dayal, Umeshwar</dc:contributor>
    <dc:creator>Ramakrishnan, Naren</dc:creator>
    <dc:creator>Dayal, Umeshwar</dc:creator>
    <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
    <dc:contributor>Sharma, Ratnesh</dc:contributor>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/36"/>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2012-06-28T09:45:49Z</dc:date>
    <dc:creator>Sharma, Ratnesh</dc:creator>
    <dcterms:abstract xml:lang="eng">The detection of previously unknown, frequently occurring patterns in time series, often called motifs, has been recognized as an important task. However, it is difficult to discover and visualize these motifs as their numbers increase, especially in large multivariate time series. To find frequent motifs, we use several temporal data mining and event encoding techniques to cluster and convert a multivariate time series to a sequence of events. Then we quantify the efficiency of the discovered motifs by linking them with a performance metric. To visualize frequent patterns in a large time series with potentially hundreds of nested motifs on a single display, we introduce three novel visual analytics methods: (1) motif layout, using colored rectangles for visualizing the occurrences and hierarchical relationships of motifs in a multivariate time series, (2) motif distortion, for enlarging or shrinking motifs as appropriate for easy analysis and (3) motif merging, to combine a number of identical adjacent motif instances without cluttering the display. Analysts can interactively optimize the degree of distortion and merging to get the best possible view. A specific motif (e.g., the most efficient or least efficient motif) can be quickly detected from a large time series for further investigation. We have applied these methods to two real-world data sets: data center cooling and oil well production. The results provide important new insights into the recurring patterns.</dcterms:abstract>
    <dc:rights>terms-of-use</dc:rights>
  </rdf:Description>
</rdf:RDF>
kops.conferencefieldIS&T/SPIE Electronic Imaging, San Francisco, Californiadeu
kops.flag.knbibliographytrue
kops.identifier.nbnurn:nbn:de:bsz:352-193924deu
kops.location.conferenceSan Francisco, California
kops.sourcefieldWONG, Pak Chung, ed. and others. <i>Visualization and Data Analysis 2011</i>. SPIE, 2011, pp. 78680J-78680J-10. SPIE Proceedings. 7868. Available under: doi: 10.1117/12.872169deu
kops.sourcefield.plainWONG, Pak Chung, ed. and others. Visualization and Data Analysis 2011. SPIE, 2011, pp. 78680J-78680J-10. SPIE Proceedings. 7868. Available under: doi: 10.1117/12.872169deu
kops.sourcefield.plainWONG, Pak Chung, ed. and others. Visualization and Data Analysis 2011. SPIE, 2011, pp. 78680J-78680J-10. SPIE Proceedings. 7868. Available under: doi: 10.1117/12.872169eng
kops.submitter.emaillarysa.herasymova@uni-konstanz.dedeu
kops.title.conferenceIS&T/SPIE Electronic Imaging
relation.isAuthorOfPublication3d0e691c-3386-4127-8c0e-608e9b72a19f
relation.isAuthorOfPublicationda7dafb0-6003-4fd4-803c-11e1e72d621a
relation.isAuthorOfPublication.latestForDiscovery3d0e691c-3386-4127-8c0e-608e9b72a19f
source.bibliographicInfo.fromPage78680J
source.bibliographicInfo.seriesNumber7868
source.bibliographicInfo.toPage78680J-10
source.contributor.editorWong, Pak Chung
source.flag.etalEditortrue
source.publisherSPIE
source.relation.ispartofseriesSPIE Proceedings
source.titleVisualization and Data Analysis 2011

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