Microwave dielectric loss at single photon energies and millikelvin temperatures

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OConnell_253021.pdf
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2008
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O'Connell, Aaron D.
Ansmann, M.
Bialczak, Radoslaw C.
Hofheinz, Max
Katz, Nadav
Lucero, Erik
McKenney, C.
Neeley, Matthew
Wang, Haohua
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Applied Physics Letters. 2008, 92(11), 112903. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.2898887
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ISO 690O'CONNELL, Aaron D., M. ANSMANN, Radoslaw C. BIALCZAK, Max HOFHEINZ, Nadav KATZ, Erik LUCERO, C. MCKENNEY, Matthew NEELEY, Haohua WANG, Eva M. WEIG, Andrew N. CLELAND, John M. MARTINIS, 2008. Microwave dielectric loss at single photon energies and millikelvin temperatures. In: Applied Physics Letters. 2008, 92(11), 112903. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.2898887
BibTex
@article{OConnell2008Micro-25302,
  year={2008},
  doi={10.1063/1.2898887},
  title={Microwave dielectric loss at single photon energies and millikelvin temperatures},
  number={11},
  volume={92},
  issn={0003-6951},
  journal={Applied Physics Letters},
  author={O'Connell, Aaron D. and Ansmann, M. and Bialczak, Radoslaw C. and Hofheinz, Max and Katz, Nadav and Lucero, Erik and McKenney, C. and Neeley, Matthew and Wang, Haohua and Weig, Eva M. and Cleland, Andrew N. and Martinis, John M.},
  note={Article Number: 112903}
}
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