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Type of Publication: | Journal article |
Publication status: | Published |
Author: | Gönnenwein, Sebastian T. B.; Schink, Sebastian W.; Brandlmaier, Andreas; Boger, Andrea; Opel, Matthias; Gross, Rudolf; Keizer, Ruurd S.; Klapwijk, Teun M.; Gupta, Amit; Huebl, Hans et al. |
Year of publication: | 2007 |
Published in: | Applied Physics Letters ; 90 (2007), 16. - 162507. - American Institute of Physics (AIP). - ISSN 0003-6951. - eISSN 1077-3118 |
DOI (citable link): | https://dx.doi.org/10.1063/1.2722027 |
Summary: |
We study the magnetoresistance properties of thin ferromagnetic CrO2 and Fe3O4 films under microwave irradiation. Both the sheet resistance ρ and the Hall voltage VHall characteristically change when a ferromagnetic resonance (FMR) occurs in the film. The electrically detected ferromagnetic resonance (EDFMR) signals closely match the conventional FMR, measured simultaneously, in both resonance fields and line shapes. The sign and the magnitude of the resonant changes Δρ∕ρ and ΔVHall∕VHall can be consistently described in terms of a Joule heating effect. Bolometric EDFMR thus is a powerful tool for the investigation of magnetic anisotropy and magnetoresistive phenomena in ferromagnetic micro- or nanostructures.
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Subject (DDC): | 530 Physics |
Refereed: | Yes |
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GÖNNENWEIN, Sebastian T. B., Sebastian W. SCHINK, Andreas BRANDLMAIER, Andrea BOGER, Matthias OPEL, Rudolf GROSS, Ruurd S. KEIZER, Teun M. KLAPWIJK, Amit GUPTA, Hans HUEBL, 2007. Electrically detected ferromagnetic resonance. In: Applied Physics Letters. American Institute of Physics (AIP). 90(16), 162507. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.2722027
@article{Gonnenwein2007Elect-52526, title={Electrically detected ferromagnetic resonance}, year={2007}, doi={10.1063/1.2722027}, number={16}, volume={90}, issn={0003-6951}, journal={Applied Physics Letters}, author={Gönnenwein, Sebastian T. B. and Schink, Sebastian W. and Brandlmaier, Andreas and Boger, Andrea and Opel, Matthias and Gross, Rudolf and Keizer, Ruurd S. and Klapwijk, Teun M. and Gupta, Amit and Huebl, Hans}, note={Article Number: 162507} }