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Improving Academic Plagiarism Detection for STEM Documents by Analyzing Mathematical Content and Citations

Improving Academic Plagiarism Detection for STEM Documents by Analyzing Mathematical Content and Citations

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MEUSCHKE, Norman, Vincent STANGE, Moritz SCHUBOTZ, Michael KRAMER, Bela GIPP, 2019. Improving Academic Plagiarism Detection for STEM Documents by Analyzing Mathematical Content and Citations. 2019 ACM/IEEE Joint Conference on Digital Libraries (JCDL). Urbana-Champaign, Illinois, Jun 2, 2019 - Jun 6, 2019. In: BONN, Maria, ed. and others. 2019 ACM/IEEE Joint Conference on Digital Libraries : JCDL 2019 : proceedings : 2-6 June 2019, Urbana-Champaign, Illinois. Piscataway, NJ:IEEE, pp. 120-129. ISBN 978-1-72811-547-4. Available under: doi: 10.1109/JCDL.2019.00026

@inproceedings{Meuschke2019-06-27T16:07:47ZImpro-50945, title={Improving Academic Plagiarism Detection for STEM Documents by Analyzing Mathematical Content and Citations}, year={2019}, doi={10.1109/JCDL.2019.00026}, isbn={978-1-72811-547-4}, address={Piscataway, NJ}, publisher={IEEE}, booktitle={2019 ACM/IEEE Joint Conference on Digital Libraries : JCDL 2019 : proceedings : 2-6 June 2019, Urbana-Champaign, Illinois}, pages={120--129}, editor={Bonn, Maria}, author={Meuschke, Norman and Stange, Vincent and Schubotz, Moritz and Kramer, Michael and Gipp, Bela} }

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