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On the Lifetime-Equivalent Defect Density : Properties, Application, and Pitfalls

On the Lifetime-Equivalent Defect Density : Properties, Application, and Pitfalls

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HERGUTH, Axel, 2019. On the Lifetime-Equivalent Defect Density : Properties, Application, and Pitfalls. In: IEEE Journal of Photovoltaics. 9(5), pp. 1182-1194. ISSN 2156-3381. eISSN 2156-3403. Available under: doi: 10.1109/JPHOTOV.2019.2922470

@article{Herguth2019-09Lifet-46999, title={On the Lifetime-Equivalent Defect Density : Properties, Application, and Pitfalls}, year={2019}, doi={10.1109/JPHOTOV.2019.2922470}, number={5}, volume={9}, issn={2156-3381}, journal={IEEE Journal of Photovoltaics}, pages={1182--1194}, author={Herguth, Axel} }

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