Controlled electromigration and oxidation of free-standing copper wires

Type of Publication: Journal article
Publication status: Published
URI (citable link): http://nbn-resolving.de/urn:nbn:de:bsz:352-2-1uy8u0pr8d6i89
Author: Hauser, Julia S.; Schwichtenberg, Jakob; Marz, Michael; Sürgers, Christoph; Seiler, Arnold; Gerhards, Uta; Messerschmidt, Florian; Hensel, Andreas; Dittmeyer, Roland; Löhneysen, Hilbert von; Hoffmann-Vogel, Regina
Year of publication: 2016
Published in: Applied Physics A ; 122 (2016), 12. - 1068. - ISSN 0947-8396. - eISSN 1432-0630
DOI (citable link): https://dx.doi.org/10.1007/s00339-016-0600-z
Summary:
We have studied controlled electromigration (EM) in free-standing copper wires. Besides electrical characterization by voltage–current measurements, structural analyses have been performed by means of scanning electron microscopy and cross-sectional microprobe measurements. We have found that oxidation during the EM in air stabilizes the free-standing wire against uncontrolled blowing, making it possible to thin the conductive part of the wire down to a conductance of a few conductance quanta G0=2e2/h. The decisive influence of oxidation by air on the EM process was confirmed by control experiments performed under ultra-high vacuum conditions. In line with these findings, free-standing Au wires were difficult to thin down reproducibly to a conductance of a few G0. Estimates of the local temperature in the free-standing wire are obtained from finite element method calculations.
Subject (DDC): 530 Physics
Link to License: Terms of use
Bibliography of Konstanz: Yes
Refereed: Yes

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HAUSER, Julia S., Jakob SCHWICHTENBERG, Michael MARZ, Christoph SÜRGERS, Arnold SEILER, Uta GERHARDS, Florian MESSERSCHMIDT, Andreas HENSEL, Roland DITTMEYER, Hilbert von LÖHNEYSEN, Regina HOFFMANN-VOGEL, 2016. Controlled electromigration and oxidation of free-standing copper wires. In: Applied Physics A. 122(12), 1068. ISSN 0947-8396. eISSN 1432-0630. Available under: doi: 10.1007/s00339-016-0600-z

@article{Hauser2016-12-01Contr-45291, title={Controlled electromigration and oxidation of free-standing copper wires}, year={2016}, doi={10.1007/s00339-016-0600-z}, number={12}, volume={122}, issn={0947-8396}, journal={Applied Physics A}, author={Hauser, Julia S. and Schwichtenberg, Jakob and Marz, Michael and Sürgers, Christoph and Seiler, Arnold and Gerhards, Uta and Messerschmidt, Florian and Hensel, Andreas and Dittmeyer, Roland and Löhneysen, Hilbert von and Hoffmann-Vogel, Regina}, note={Article Number: 1068} }

Hensel, Andreas Schwichtenberg, Jakob Seiler, Arnold Dittmeyer, Roland We have studied controlled electromigration (EM) in free-standing copper wires. Besides electrical characterization by voltage–current measurements, structural analyses have been performed by means of scanning electron microscopy and cross-sectional microprobe measurements. We have found that oxidation during the EM in air stabilizes the free-standing wire against uncontrolled blowing, making it possible to thin the conductive part of the wire down to a conductance of a few conductance quanta G<sub>0</sub>=2e<sup>2</sup>/h. The decisive influence of oxidation by air on the EM process was confirmed by control experiments performed under ultra-high vacuum conditions. In line with these findings, free-standing Au wires were difficult to thin down reproducibly to a conductance of a few G<sub>0</sub>. Estimates of the local temperature in the free-standing wire are obtained from finite element method calculations. Hoffmann-Vogel, Regina Hoffmann-Vogel, Regina Sürgers, Christoph Sürgers, Christoph 2019-03-04T14:47:41Z terms-of-use Marz, Michael Hauser, Julia S. eng Marz, Michael Seiler, Arnold Hensel, Andreas 2019-03-04T14:47:41Z Messerschmidt, Florian Schwichtenberg, Jakob Löhneysen, Hilbert von Gerhards, Uta Löhneysen, Hilbert von 2016-12-01 Hauser, Julia S. Messerschmidt, Florian Dittmeyer, Roland Controlled electromigration and oxidation of free-standing copper wires Gerhards, Uta

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