Influence of dielectric layers and thermal load on LeTID

Cite This

Files in this item

Checksum: MD5:5032130301600d502fb5922e5654e7e9

WINTER, Clemens, Annika ZUSCHLAG, Daniel SKORKA, Giso HAHN, 2018. Influence of dielectric layers and thermal load on LeTID. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Lausanne, Mar 19, 2018 - Mar 21, 2018. In: BALLIF, Christopher, ed. and others. SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics. Melville, NY:AIP Publishing, 130020. ISSN 0094-243X. eISSN 1551-7616. ISBN 978-0-7354-1715-1. Available under: doi: 10.1063/1.5049339

@inproceedings{Winter2018Influ-43642, title={Influence of dielectric layers and thermal load on LeTID}, year={2018}, doi={10.1063/1.5049339}, number={1999,1}, isbn={978-0-7354-1715-1}, issn={0094-243X}, address={Melville, NY}, publisher={AIP Publishing}, series={AIP Conference Proceedings}, booktitle={SiliconPV, the 8th International Conference on Crystalline Silicon Photovoltaics}, editor={Ballif, Christopher}, author={Winter, Clemens and Zuschlag, Annika and Skorka, Daniel and Hahn, Giso}, note={Article Number: 130020} }

<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/43642"> <dcterms:rights rdf:resource="https://kops.uni-konstanz.de/page/termsofuse"/> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:rights>terms-of-use</dc:rights> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dcterms:title>Influence of dielectric layers and thermal load on LeTID</dcterms:title> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-11-05T10:23:03Z</dcterms:available> <dc:creator>Hahn, Giso</dc:creator> <dc:creator>Zuschlag, Annika</dc:creator> <dc:contributor>Hahn, Giso</dc:contributor> <dcterms:abstract xml:lang="eng">Light and elevated temperature induced degradation (LeTID) is observed for multicrystalline (mc) Si passivated emitter and rear cell (PERC) solar cells, strongly limiting solar cell parameters under operation conditions. In this contribution, we investigate the effect of surface passivation layer being present during the firing step based on lifetime samples. The LeTID effect is only observed if the surface passivation layer is present during the firing step. Samples without firing step show no LeTID. A re-passivation of the surface significantly changes the LeTID effect, showing that the whole sample treatment, temperature load and hydrogen content of a sample has to be taken into account investigating and evaluating LeTID.</dcterms:abstract> <dc:contributor>Winter, Clemens</dc:contributor> <dc:contributor>Skorka, Daniel</dc:contributor> <dc:creator>Skorka, Daniel</dc:creator> <dc:creator>Winter, Clemens</dc:creator> <dc:contributor>Zuschlag, Annika</dc:contributor> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dcterms:issued>2018</dcterms:issued> <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/43642"/> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-11-05T10:23:03Z</dc:date> <dc:language>eng</dc:language> </rdf:Description> </rdf:RDF>

This item appears in the following Collection(s)

Search KOPS


Browse

My Account