Type of Publication: | Contribution to a conference collection |
Publication status: | Published |
URI (citable link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-2-1v0t5tp4yx2gx0 |
Author: | Buonassisi, Tonio; Istratov, Andrei A.; Pickett, Matthew D.; Marcus, Matthew A.; Hahn, Giso; Riepe, Stephan; Isenberg, Jörg; Warta, Wilhelm; Willeke, Gerd; Ciszek, Ted F. et al. |
Year of publication: | 2005 |
Conference: | 15th NREL Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes, Aug 7, 2005 - Aug 10, 2005, Vail, Colorado |
Published in: | 15th Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes : extended abstracts and papers / Sopori, Bhushan L. (ed.). - Golden, Colorado : NREL, 2005. - pp. 141-144 |
URL of original publication: | https://www.nrel.gov/docs/fy06osti/38573.pdf, Last access on Jun 11, 2018 |
Subject (DDC): | 530 Physics |
Link to License: | In Copyright |
BUONASSISI, Tonio, Andrei A. ISTRATOV, Matthew D. PICKETT, Matthew A. MARCUS, Giso HAHN, Stephan RIEPE, Jörg ISENBERG, Wilhelm WARTA, Gerd WILLEKE, Ted F. CISZEK, 2005. Synchrotron-based spectrally-resolved X-ray beam induced current : a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon. 15th NREL Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes. Vail, Colorado, Aug 7, 2005 - Aug 10, 2005. In: SOPORI, Bhushan L., ed.. 15th Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes : extended abstracts and papers. Golden, Colorado:NREL, pp. 141-144
@inproceedings{Buonassisi2005Synch-42532, title={Synchrotron-based spectrally-resolved X-ray beam induced current : a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon}, url={https://www.nrel.gov/docs/fy06osti/38573.pdf}, year={2005}, address={Golden, Colorado}, publisher={NREL}, booktitle={15th Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes : extended abstracts and papers}, pages={141--144}, editor={Sopori, Bhushan L.}, author={Buonassisi, Tonio and Istratov, Andrei A. and Pickett, Matthew D. and Marcus, Matthew A. and Hahn, Giso and Riepe, Stephan and Isenberg, Jörg and Warta, Wilhelm and Willeke, Gerd and Ciszek, Ted F.} }
<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/42532"> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dc:creator>Istratov, Andrei A.</dc:creator> <dc:creator>Isenberg, Jörg</dc:creator> <dcterms:issued>2005</dcterms:issued> <dc:contributor>Isenberg, Jörg</dc:contributor> <dc:contributor>Istratov, Andrei A.</dc:contributor> <dc:creator>Willeke, Gerd</dc:creator> <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/42532/3/Buonassisi_2-1v0t5tp4yx2gx0.pdf"/> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dc:creator>Marcus, Matthew A.</dc:creator> <dc:language>eng</dc:language> <dc:creator>Buonassisi, Tonio</dc:creator> <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/42532"/> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-06-11T12:44:39Z</dcterms:available> <dc:contributor>Hahn, Giso</dc:contributor> <dc:contributor>Warta, Wilhelm</dc:contributor> <dc:contributor>Marcus, Matthew A.</dc:contributor> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-06-11T12:44:39Z</dc:date> <dc:creator>Hahn, Giso</dc:creator> <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/42532/3/Buonassisi_2-1v0t5tp4yx2gx0.pdf"/> <dcterms:title>Synchrotron-based spectrally-resolved X-ray beam induced current : a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon</dcterms:title> <dc:contributor>Riepe, Stephan</dc:contributor> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dc:rights>terms-of-use</dc:rights> <dc:creator>Riepe, Stephan</dc:creator> <dc:creator>Pickett, Matthew D.</dc:creator> <dc:contributor>Ciszek, Ted F.</dc:contributor> <dc:creator>Warta, Wilhelm</dc:creator> <dc:creator>Ciszek, Ted F.</dc:creator> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:contributor>Buonassisi, Tonio</dc:contributor> <dc:contributor>Willeke, Gerd</dc:contributor> <dc:contributor>Pickett, Matthew D.</dc:contributor> <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/> </rdf:Description> </rdf:RDF>
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