Synchrotron-based spectrally-resolved X-ray beam induced current : a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon
| Publikationstyp: | Beitrag zu einer Konferenz |
| Publikationsstatus: | Published |
| URI (zitierfähiger Link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-2-1v0t5tp4yx2gx0 |
| Autor/innen: | Buonassissi, Tonio; Istratov, Andrei A.; Pickett, Matthew D.; Marcus, Matthew A.; Hahn, Giso; Riepe, Stephan; Isenberg, Jörg; Warta, Wilhelm; Willeke, Gerd; Ciszek, Ted F. et al. |
| Erscheinungsjahr: | 2005 |
| Konferenz: | 15th NREL Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes, 7. Aug 2005 - 10. Aug 2005, Vail, Colorado |
| Erschienen in: | 15th Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes : extended abstracts and papers / Sopori, Bhushan L. (Hrsg.). - Golden, Colorado : NREL, 2005. - S. 141-144 |
| URL der Originalveröffentlichung: | https://www.nrel.gov/docs/fy06osti/38573.pdf, Letzter Zugriff am 11. Jun 2018 |
| Fachgebiet (DDC): | 530 Physik |
| Link zur Lizenz: | Nutzungsbedingungen |
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BUONASSISSI, Tonio, Andrei A. ISTRATOV, Matthew D. PICKETT, Matthew A. MARCUS, Giso HAHN, Stephan RIEPE, Jörg ISENBERG, Wilhelm WARTA, Gerd WILLEKE, Ted F. CISZEK, 2005. Synchrotron-based spectrally-resolved X-ray beam induced current : a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon. 15th NREL Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes. Vail, Colorado, 7. Aug 2005 - 10. Aug 2005. In: SOPORI, Bhushan L., ed.. 15th Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes : extended abstracts and papers. 15th NREL Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes. Vail, Colorado, 7. Aug 2005 - 10. Aug 2005. Golden, Colorado:NREL, pp. 141-144
@inproceedings{Buonassissi2005Synch-42532, title={Synchrotron-based spectrally-resolved X-ray beam induced current : a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon}, url={https://www.nrel.gov/docs/fy06osti/38573.pdf}, year={2005}, address={Golden, Colorado}, publisher={NREL}, booktitle={15th Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes : extended abstracts and papers}, pages={141--144}, editor={Sopori, Bhushan L.}, author={Buonassissi, Tonio and Istratov, Andrei A. and Pickett, Matthew D. and Marcus, Matthew A. and Hahn, Giso and Riepe, Stephan and Isenberg, Jörg and Warta, Wilhelm and Willeke, Gerd and Ciszek, Ted F.} }
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Dateiabrufe seit 11.06.2018 (Informationen über die Zugriffsstatistik)
| Buonassisi_2-1v0t5tp4yx2gx0.pdf | 9 |
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