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Synchrotron-based spectrally-resolved X-ray beam induced current : a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon

Synchrotron-based spectrally-resolved X-ray beam induced current : a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon

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BUONASSISI, Tonio, Andrei A. ISTRATOV, Matthew D. PICKETT, Matthew A. MARCUS, Giso HAHN, Stephan RIEPE, Jörg ISENBERG, Wilhelm WARTA, Gerd WILLEKE, Ted F. CISZEK, 2005. Synchrotron-based spectrally-resolved X-ray beam induced current : a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon. 15th NREL Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes. Vail, Colorado, Aug 7, 2005 - Aug 10, 2005. In: SOPORI, Bhushan L., ed.. 15th Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes : extended abstracts and papers. Golden, Colorado:NREL, pp. 141-144

@inproceedings{Buonassisi2005Synch-42532, title={Synchrotron-based spectrally-resolved X-ray beam induced current : a technique to quantify the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon}, url={https://www.nrel.gov/docs/fy06osti/38573.pdf}, year={2005}, address={Golden, Colorado}, publisher={NREL}, booktitle={15th Workshop on Crystalline Silicon Solar Cells and Modules : Materials and Processes : extended abstracts and papers}, pages={141--144}, editor={Sopori, Bhushan L.}, author={Buonassisi, Tonio and Istratov, Andrei A. and Pickett, Matthew D. and Marcus, Matthew A. and Hahn, Giso and Riepe, Stephan and Isenberg, Jörg and Warta, Wilhelm and Willeke, Gerd and Ciszek, Ted F.} }

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