Accurate Depth and Normal Maps from Occlusion-Aware Focal Stack Symmetry

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STRECKE, Michael, Anna ALPEROVICH, Bastian GOLDLÜCKE, 2017. Accurate Depth and Normal Maps from Occlusion-Aware Focal Stack Symmetry. 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR). Honolulu, HI, 21. Jul 2017 - 26. Jul 2017. In: O'CONNER, Lisa, ed.. 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR). 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR). Honolulu, HI, 21. Jul 2017 - 26. Jul 2017. Piscataway, NJ:IEEE, pp. 2529-2537. ISSN 1063-6919. ISBN 978-1-5386-0457-1. Available under: doi: 10.1109/CVPR.2017.271

@inproceedings{Strecke2017Accur-41705, title={Accurate Depth and Normal Maps from Occlusion-Aware Focal Stack Symmetry}, year={2017}, doi={10.1109/CVPR.2017.271}, isbn={978-1-5386-0457-1}, issn={1063-6919}, address={Piscataway, NJ}, publisher={IEEE}, series={IEEE Xplore Digital Library}, booktitle={2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)}, pages={2529--2537}, editor={O'Conner, Lisa}, author={Strecke, Michael and Alperovich, Anna and Goldlücke, Bastian} }

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