@article{Park2018-01-07Dynam-41645,
  year={2018},
  doi={10.1063/1.5011686},
  title={Dynamic secondary ion mass spectroscopy of Au nanoparticles on Si wafer using Bi<sub>3</sub><sup>+</sup> as primary ion coupled with surface etching by Ar cluster ion beam : The effect of etching conditions on surface structure},
  number={1},
  volume={123},
  issn={0021-8979},
  journal={Journal of Applied Physics},
  author={Park, Eun Ji and Choi, Chang Min and Kim, Il Hee and Kim, Jung-Hwan and Lee, Gaehang and Jin, Jong Sung and Ganteför, Gerd and Kim, Young Dok and Choi, Myoung Choul},
  note={Article Number: 015303}
}

<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41645">
    <dc:contributor>Kim, Jung-Hwan</dc:contributor>
    <dc:contributor>Ganteför, Gerd</dc:contributor>
    <dc:creator>Lee, Gaehang</dc:creator>
    <dc:language>eng</dc:language>
    <dc:creator>Jin, Jong Sung</dc:creator>
    <dc:creator>Choi, Chang Min</dc:creator>
    <dc:contributor>Kim, Young Dok</dc:contributor>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-03-01T07:55:36Z</dc:date>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dcterms:issued>2018-01-07</dcterms:issued>
    <dc:contributor>Choi, Myoung Choul</dc:contributor>
    <dc:contributor>Choi, Chang Min</dc:contributor>
    <dc:creator>Kim, Il Hee</dc:creator>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-03-01T07:55:36Z</dcterms:available>
    <dc:contributor>Park, Eun Ji</dc:contributor>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/41645"/>
    <dc:creator>Kim, Jung-Hwan</dc:creator>
    <dc:contributor>Kim, Il Hee</dc:contributor>
    <dc:creator>Ganteför, Gerd</dc:creator>
    <dc:creator>Kim, Young Dok</dc:creator>
    <dc:creator>Choi, Myoung Choul</dc:creator>
    <dc:contributor>Lee, Gaehang</dc:contributor>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dc:creator>Park, Eun Ji</dc:creator>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:contributor>Jin, Jong Sung</dc:contributor>
    <dcterms:title>Dynamic secondary ion mass spectroscopy of Au nanoparticles on Si wafer using Bi&lt;sub&gt;3&lt;/sub&gt;&lt;sup&gt;+&lt;/sup&gt; as primary ion coupled with surface etching by Ar cluster ion beam : The effect of etching conditions on surface structure</dcterms:title>
  </rdf:Description>
</rdf:RDF>