Pixnostics : Towards Measuring the Value of Visualization


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SCHNEIDEWIND, Jorn, Mike SIPS, Daniel A. KEIM, 2006. Pixnostics : Towards Measuring the Value of Visualization. 2006 IEEE Symposium On Visual Analytics And Technology. Baltimore, MD, USA, 31. Okt 2006 - 31. Okt 2006. In: WONG, Pak Chung, ed., Daniel A. KEIM, ed.. 2006 IEEE Symposium On Visual Analytics And Technology. Piscataway:IEEE, pp. 199-206. ISBN 1-4244-0592-0. Available under: doi: 10.1109/VAST.2006.261423

@inproceedings{Schneidewind2006Pixno-40710, title={Pixnostics : Towards Measuring the Value of Visualization}, year={2006}, doi={10.1109/VAST.2006.261423}, isbn={1-4244-0592-0}, address={Piscataway}, publisher={IEEE}, booktitle={2006 IEEE Symposium On Visual Analytics And Technology}, pages={199--206}, editor={Wong, Pak Chung and Keim, Daniel A.}, author={Schneidewind, Jorn and Sips, Mike and Keim, Daniel A.} }

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