Proton irradiation defects in (fluoranthene)2PF6

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STÖFFLER, D., Malte DRESCHER, De Saez DE JAUREGUI, J. GMEINER, Elmar DORMANN, 2007. Proton irradiation defects in (fluoranthene)2PF6. In: Physics Letters A. 363(4), pp. 317-321. ISSN 0375-9601. eISSN 1873-2429. Available under: doi: 10.1016/j.physleta.2006.11.017

@article{Stoffler2007Proto-40225, title={Proton irradiation defects in (fluoranthene)2PF6}, year={2007}, doi={10.1016/j.physleta.2006.11.017}, number={4}, volume={363}, issn={0375-9601}, journal={Physics Letters A}, pages={317--321}, author={Stöffler, D. and Drescher, Malte and de Jauregui, De Saez and Gmeiner, J. and Dormann, Elmar} }

Gmeiner, J. Stöffler, D. de Jauregui, De Saez Dormann, Elmar Dormann, Elmar 2007 Electron spin resonance and electron–proton double resonance (Overhauser shift method) are used for the comparison of proton radiation damaged and as-grown (fluoranthene)<sub>2</sub>PF<sub>6</sub> single crystals. Chemical modification and various consequences of the nonuniform distribution of radiation induced defects in this quasi-one-dimensional organic conductor with defect dependent Peierls transition are worked out. Gmeiner, J. eng Stöffler, D. 2017-10-04T07:47:20Z Proton irradiation defects in (fluoranthene)<sub>2</sub>PF<sub>6</sub> Drescher, Malte de Jauregui, De Saez 2017-10-04T07:47:20Z Drescher, Malte

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