Serial Synchrotron X-Ray Crystallography (SSX)

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DIEDERICHS, Kay, Meitian WANG, 2017. Serial Synchrotron X-Ray Crystallography (SSX). In: WLODAWER, Alexander, ed., Zbigniew DAUTER, ed., Mariusz JASKOLSKI, ed.. Protein Crystallography : Methods and Protocols. New York, NY:Humana Press, pp. 239-272. ISBN 978-1-4939-6998-2

@incollection{Diederichs2017-06-02Seria-39798, title={Serial Synchrotron X-Ray Crystallography (SSX)}, year={2017}, doi={10.1007/978-1-4939-7000-1_10}, number={1607}, isbn={978-1-4939-6998-2}, address={New York, NY}, publisher={Humana Press}, series={Methods in Molecular Biology}, booktitle={Protein Crystallography : Methods and Protocols}, pages={239--272}, editor={Wlodawer, Alexander and Dauter, Zbigniew and Jaskolski, Mariusz}, author={Diederichs, Kay and Wang, Meitian} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/39798"> <dc:language>eng</dc:language> <dc:creator>Diederichs, Kay</dc:creator> <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/39798"/> <dc:contributor>Diederichs, Kay</dc:contributor> <dcterms:issued>2017-06-02</dcterms:issued> <dc:creator>Wang, Meitian</dc:creator> <dcterms:title>Serial Synchrotron X-Ray Crystallography (SSX)</dcterms:title> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2017-08-08T15:07:14Z</dcterms:available> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2017-08-08T15:07:14Z</dc:date> <dcterms:abstract xml:lang="eng">Prompted by methodological advances in measurements with X-ray free electron lasers, it was realized in the last two years that traditional (or conventional) methods for data collection from crystals of macromolecular specimens can be complemented by synchrotron measurements on microcrystals that would individually not suffice for a complete data set. Measuring, processing, and merging many partial data sets of this kind requires new techniques which have since been implemented at several third-generation synchrotron facilities, and are described here. Among these, we particularly focus on the possibility of in situ measurements combined with in meso crystal preparations and data analysis with the XDS package and auxiliary programs.</dcterms:abstract> <dc:contributor>Wang, Meitian</dc:contributor> </rdf:Description> </rdf:RDF>

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