Multi-characterization study of interface passivation quality of amorphous sub-stoichiometric silicon oxide and silicon oxynitride layers for photovoltaic applications

Steffens, Jonathan; Fazio, Maria Antonietta; Cavalcoli, Daniela; Terheiden, Barbara

Multi-characterization study of interface passivation quality of amorphous sub-stoichiometric silicon oxide and silicon oxynitride layers for photovoltaic applications

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Datum

2018

Autor:innen

Steffens, Jonathan

Fazio, Maria Antonietta

Cavalcoli, Daniela

Terheiden, Barbara

DOI (zitierfähiger Link)

https://doi.org/10.1016/j.solmat.2018.07.024

Sammlungen

Physik

Publikationstyp

Zeitschriftenartikel

Publikationsstatus

Published

Erschienen in

Solar Energy Materials and Solar Cells. 2018, 187, pp. 104-112. ISSN 0927-0248. eISSN 1879-3398. Available under: doi: 10.1016/j.solmat.2018.07.024

Fachgebiet (DDC)

530 Physik

Zitieren

ISO 690

STEFFENS, Jonathan, Maria Antonietta FAZIO, Daniela CAVALCOLI, Barbara TERHEIDEN, 2018. Multi-characterization study of interface passivation quality of amorphous sub-stoichiometric silicon oxide and silicon oxynitride layers for photovoltaic applications. In: Solar Energy Materials and Solar Cells. 2018, 187, pp. 104-112. ISSN 0927-0248. eISSN 1879-3398. Available under: doi: 10.1016/j.solmat.2018.07.024

BibTex

@article{Steffens2018-12Multi-43427,
  year={2018},
  doi={10.1016/j.solmat.2018.07.024},
  title={Multi-characterization study of interface passivation quality of amorphous sub-stoichiometric silicon oxide and silicon oxynitride layers for photovoltaic applications},
  volume={187},
  issn={0927-0248},
  journal={Solar Energy Materials and Solar Cells},
  pages={104--112},
  author={Steffens, Jonathan and Fazio, Maria Antonietta and Cavalcoli, Daniela and Terheiden, Barbara}
}

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