In Situ Observation of the Degradation in Multi‐Crystalline Si Solar Cells by Electroluminescence

Lade...
Vorschaubild
Dateien
Zu diesem Dokument gibt es keine Dateien.
Datum
2019
Autor:innen
Mchedlidze, Teimuraz
Alam, Md Mahabubul
Weber, Joerg
Herausgeber:innen
Kontakt
ISSN der Zeitschrift
Electronic ISSN
ISBN
Bibliografische Daten
Verlag
Schriftenreihe
Auflagebezeichnung
URI (zitierfähiger Link)
ArXiv-ID
Internationale Patentnummer
Angaben zur Forschungsförderung
Projekt
Open Access-Veröffentlichung
Sammlungen
Core Facility der Universität Konstanz
Gesperrt bis
Titel in einer weiteren Sprache
Forschungsvorhaben
Organisationseinheiten
Zeitschriftenheft
Publikationstyp
Zeitschriftenartikel
Publikationsstatus
Published
Erschienen in
Physica Status Solidi (A) - Applications and Materials Science. 2019, 216(17), 1800918. ISSN 1862-6300. eISSN 1862-6319. Available under: doi: 10.1002/pssa.201800918
Zusammenfassung

Carrier‐induced efficiency degradation of multi‐crystalline Si (mc‐Si) solar cells is studied in situ by detecting the electroluminescence (EL) from the cells. Series of spatially resolved EL images of the cells during constant forward current operation at low (24 °C) and at elevated (70 °C) temperatures are recorded. The degradation induced changes in the open circuit voltage correlate well with changes in the EL intensities. The similarity of light‐induced and carrier‐induced degradation processes for mc‐Si cells is confirmed. The correlation of the degradation with the material structure is analyzed. The degradation appears to correlate with the density of structural defects in the cells. The results verify that EL images present a powerful tool for in situ analyses of mc‐Si cell degradation processes in various cell structures with a broad variety of biasing and temperature conditions.

Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
Konferenz
Rezension
undefined / . - undefined, undefined
Zitieren
ISO 690MCHEDLIDZE, Teimuraz, Md Mahabubul ALAM, Axel HERGUTH, Joerg WEBER, 2019. In Situ Observation of the Degradation in Multi‐Crystalline Si Solar Cells by Electroluminescence. In: Physica Status Solidi (A) - Applications and Materials Science. 2019, 216(17), 1800918. ISSN 1862-6300. eISSN 1862-6319. Available under: doi: 10.1002/pssa.201800918
BibTex
@article{Mchedlidze2019-09Obser-47186,
  year={2019},
  doi={10.1002/pssa.201800918},
  title={In Situ Observation of the Degradation in Multi‐Crystalline Si Solar Cells by Electroluminescence},
  number={17},
  volume={216},
  issn={1862-6300},
  journal={Physica Status Solidi (A) - Applications and Materials Science},
  author={Mchedlidze, Teimuraz and Alam, Md Mahabubul and Herguth, Axel and Weber, Joerg},
  note={Article Number: 1800918}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/47186">
    <dc:creator>Weber, Joerg</dc:creator>
    <dc:creator>Herguth, Axel</dc:creator>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:contributor>Mchedlidze, Teimuraz</dc:contributor>
    <dcterms:title>In Situ Observation of the Degradation in Multi‐Crystalline Si Solar Cells by Electroluminescence</dcterms:title>
    <dc:contributor>Herguth, Axel</dc:contributor>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:creator>Mchedlidze, Teimuraz</dc:creator>
    <dcterms:issued>2019-09</dcterms:issued>
    <dc:contributor>Alam, Md Mahabubul</dc:contributor>
    <dc:creator>Alam, Md Mahabubul</dc:creator>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2019-10-10T12:58:45Z</dc:date>
    <dcterms:abstract xml:lang="eng">Carrier‐induced efficiency degradation of multi‐crystalline Si (mc‐Si) solar cells is studied in situ by detecting the electroluminescence (EL) from the cells. Series of spatially resolved EL images of the cells during constant forward current operation at low (24 °C) and at elevated (70 °C) temperatures are recorded. The degradation induced changes in the open circuit voltage correlate well with changes in the EL intensities. The similarity of light‐induced and carrier‐induced degradation processes for mc‐Si cells is confirmed. The correlation of the degradation with the material structure is analyzed. The degradation appears to correlate with the density of structural defects in the cells. The results verify that EL images present a powerful tool for in situ analyses of mc‐Si cell degradation processes in various cell structures with a broad variety of biasing and temperature conditions.</dcterms:abstract>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2019-10-10T12:58:45Z</dcterms:available>
    <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/47186"/>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:contributor>Weber, Joerg</dc:contributor>
    <dc:language>eng</dc:language>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
  </rdf:Description>
</rdf:RDF>
Interner Vermerk
xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter
Kontakt
URL der Originalveröffentl.
Prüfdatum der URL
Prüfungsdatum der Dissertation
Finanzierungsart
Kommentar zur Publikation
Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja
Begutachtet
Ja
Diese Publikation teilen