Electrically detected ferromagnetic resonance

Kurzanzeige
dc.contributor.authorGoennenwein, Sebastian T. B.
dc.contributor.authorSchink, Sebastian W.
dc.contributor.authorBrandlmaier, Andreas
dc.contributor.authorBoger, Andrea
dc.contributor.authorOpel, Matthias
dc.contributor.authorGross, Rudolf
dc.contributor.authorKeizer, Ruurd S.
dc.contributor.authorKlapwijk, Teun M.
dc.contributor.authorGupta, Amit
dc.contributor.authorHuebl, Hans
dc.date.accessioned2021-01-20T13:24:33Z
dc.date.available2021-01-20T13:24:33Z
dc.date.issued2007eng
dc.description.abstractWe study the magnetoresistance properties of thin ferromagnetic CrO2 and Fe3O4 films under microwave irradiation. Both the sheet resistance ρ and the Hall voltage VHall characteristically change when a ferromagnetic resonance (FMR) occurs in the film. The electrically detected ferromagnetic resonance (EDFMR) signals closely match the conventional FMR, measured simultaneously, in both resonance fields and line shapes. The sign and the magnitude of the resonant changes Δρ∕ρ and ΔVHall∕VHall can be consistently described in terms of a Joule heating effect. Bolometric EDFMR thus is a powerful tool for the investigation of magnetic anisotropy and magnetoresistive phenomena in ferromagnetic micro- or nanostructures.eng
dc.description.versionpublishedeng
dc.identifier.doi10.1063/1.2722027eng
dc.identifier.urihttps://kops.uni-konstanz.de/handle/123456789/52526
dc.language.isoengeng
dc.rightsterms-of-use
dc.rights.urihttps://rightsstatements.org/page/InC/1.0/
dc.subject.ddc530eng
dc.titleElectrically detected ferromagnetic resonanceeng
dc.typeJOURNAL_ARTICLEeng
dspace.entity.typePublication
kops.citation.bibtex
@article{Goennenwein2007Elect-52526,
  year={2007},
  doi={10.1063/1.2722027},
  title={Electrically detected ferromagnetic resonance},
  number={16},
  volume={90},
  issn={0003-6951},
  journal={Applied Physics Letters},
  author={Goennenwein, Sebastian T. B. and Schink, Sebastian W. and Brandlmaier, Andreas and Boger, Andrea and Opel, Matthias and Gross, Rudolf and Keizer, Ruurd S. and Klapwijk, Teun M. and Gupta, Amit and Huebl, Hans},
  note={Article Number: 162507}
}
kops.citation.iso690GOENNENWEIN, Sebastian T. B., Sebastian W. SCHINK, Andreas BRANDLMAIER, Andrea BOGER, Matthias OPEL, Rudolf GROSS, Ruurd S. KEIZER, Teun M. KLAPWIJK, Amit GUPTA, Hans HUEBL, 2007. Electrically detected ferromagnetic resonance. In: Applied Physics Letters. American Institute of Physics (AIP). 2007, 90(16), 162507. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.2722027deu
kops.citation.iso690GOENNENWEIN, Sebastian T. B., Sebastian W. SCHINK, Andreas BRANDLMAIER, Andrea BOGER, Matthias OPEL, Rudolf GROSS, Ruurd S. KEIZER, Teun M. KLAPWIJK, Amit GUPTA, Hans HUEBL, 2007. Electrically detected ferromagnetic resonance. In: Applied Physics Letters. American Institute of Physics (AIP). 2007, 90(16), 162507. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.2722027eng
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    <dcterms:abstract xml:lang="eng">We study the magnetoresistance properties of thin ferromagnetic CrO&lt;sub&gt;2&lt;/sub&gt; and Fe&lt;sub&gt;3&lt;/sub&gt;O&lt;sub&gt;4&lt;/sub&gt; films under microwave irradiation. Both the sheet resistance ρ and the Hall voltage V&lt;sub&gt;Hall&lt;/sub&gt; characteristically change when a ferromagnetic resonance (FMR) occurs in the film. The electrically detected ferromagnetic resonance (EDFMR) signals closely match the conventional FMR, measured simultaneously, in both resonance fields and line shapes. The sign and the magnitude of the resonant changes Δρ∕ρ and ΔV&lt;sub&gt;Hall&lt;/sub&gt;∕V&lt;sub&gt;Hall&lt;/sub&gt; can be consistently described in terms of a Joule heating effect. Bolometric EDFMR thus is a powerful tool for the investigation of magnetic anisotropy and magnetoresistive phenomena in ferromagnetic micro- or nanostructures.</dcterms:abstract>
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kops.sourcefieldApplied Physics Letters. American Institute of Physics (AIP). 2007, <b>90</b>(16), 162507. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.2722027deu
kops.sourcefield.plainApplied Physics Letters. American Institute of Physics (AIP). 2007, 90(16), 162507. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.2722027deu
kops.sourcefield.plainApplied Physics Letters. American Institute of Physics (AIP). 2007, 90(16), 162507. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.2722027eng
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source.bibliographicInfo.articleNumber162507eng
source.bibliographicInfo.issue16eng
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source.identifier.eissn1077-3118eng
source.identifier.issn0003-6951eng
source.periodicalTitleApplied Physics Letterseng
source.publisherAmerican Institute of Physics (AIP)eng

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