Publikation:

Injection resolved spatial lifetime mapping using photoluminescence

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2019

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http://nbn-resolving.de/urn:nbn:de:bsz:352-2-1f3gmjljnfhg35
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https://doi.org/10.1063/1.5123820
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POORTMANS, Jef, ed. and others. SiliconPV 2019, The 9th International Conference on Crystalline Silicon Photovoltaics : 8-10 April 2019, Leuven, Belgium. Melville, New York: AIP Publishing, 2019, 020015. AIP Conference Proceedings. 2147,1. eISSN 0094-243X. ISBN 978-0-7354-1892-9. Available under: doi: 10.1063/1.5123820

Zusammenfassung

The excess minority charge carrier lifetime τeff is an important metric for the performance of silicon based photovoltaic devices. In addition, its dependence on excess charge carrier concentration Δn can be used to identify defects and defect configurations. In multicrystalline (mc) silicon materials with strong local variations in quality and contamination, this dependence needs to be known with spatial resolution. Even in high quality Floatzone silicon (FZ-Si) wafers localized defects may exist. In this work, we employ Time Resolved PhotoLuminescence Imaging (TR-PLI) to obtain spatially resolved lifetime maps of silicon wafers passivated with aluminum oxide at different levels of excitation with light. Using this data, we determine the spatially resolved injection dependence for each pixel separately, without recourse to another method of lifetime measurement.

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530 Physik

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SiliconPV 2019, The 9th International Conference on Crystalline Silicon Photovoltaics, 8. Apr. 2019 - 10. Apr. 2019, Leuven, Belgium
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ISO 690SKORKA, Daniel, Annika ZUSCHLAG, Giso HAHN, 2019. Injection resolved spatial lifetime mapping using photoluminescence. SiliconPV 2019, The 9th International Conference on Crystalline Silicon Photovoltaics. Leuven, Belgium, 8. Apr. 2019 - 10. Apr. 2019. In: POORTMANS, Jef, ed. and others. SiliconPV 2019, The 9th International Conference on Crystalline Silicon Photovoltaics : 8-10 April 2019, Leuven, Belgium. Melville, New York: AIP Publishing, 2019, 020015. AIP Conference Proceedings. 2147,1. eISSN 0094-243X. ISBN 978-0-7354-1892-9. Available under: doi: 10.1063/1.5123820
BibTex
@inproceedings{Skorka2019Injec-46822,
  year={2019},
  doi={10.1063/1.5123820},
  title={Injection resolved spatial lifetime mapping using photoluminescence},
  number={2147,1},
  isbn={978-0-7354-1892-9},
  publisher={AIP Publishing},
  address={Melville, New York},
  series={AIP Conference Proceedings},
  booktitle={SiliconPV 2019, The 9th International Conference on Crystalline Silicon Photovoltaics : 8-10 April 2019, Leuven, Belgium},
  editor={Poortmans, Jef},
  author={Skorka, Daniel and Zuschlag, Annika and Hahn, Giso},
  note={Article Number: 020015}
}
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