Publikation: Implantation studies of low-energy positive muons in niobium thin films
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Datum
2026
Autor:innen
McFadden, Ryan M.L.
Suter, Andreas
Müller, Arnold M.
Prokscha, Thomas
Salman, Zaher
Junginger, Tobias
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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Elsevier. 2026, 570, 165954. ISSN 0168-583X. eISSN 1872-9584. Verfügbar unter: doi: 10.1016/j.nimb.2025.165954
Zusammenfassung
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Fachgebiet (DDC)
530 Physik
Schlagwörter
Implantation profiles, Muon energy loss, Low energy muons, Muon spin spectroscopy, Niobium, Thin films
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MCFADDEN, Ryan M.L., Andreas SUTER, Leon RUF, Angelo DI BERNARDO, Arnold M. MÜLLER, Thomas PROKSCHA, Zaher SALMAN, Tobias JUNGINGER, 2026. Implantation studies of low-energy positive muons in niobium thin films. In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. Elsevier. 2026, 570, 165954. ISSN 0168-583X. eISSN 1872-9584. Verfügbar unter: doi: 10.1016/j.nimb.2025.165954BibTex
@article{McFadden2026-01Impla-76248,
title={Implantation studies of low-energy positive muons in niobium thin films},
year={2026},
doi={10.1016/j.nimb.2025.165954},
volume={570},
issn={0168-583X},
journal={Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms},
author={McFadden, Ryan M.L. and Suter, Andreas and Ruf, Leon and Di Bernardo, Angelo and Müller, Arnold M. and Prokscha, Thomas and Salman, Zaher and Junginger, Tobias},
note={Article Number: 165954}
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