Publikation: Transition metal precipitates in mc Si : a new detection method using 3D-FIB
Lade...
Dateien
Datum
2013
Herausgeber:innen
ISSN der Zeitschrift
Electronic ISSN
ISBN
Bibliografische Daten
Verlag
Schriftenreihe
Auflagebezeichnung
URI (zitierfähiger Link)
DOI (zitierfähiger Link)
Internationale Patentnummer
Link zur Lizenz
Angaben zur Forschungsförderung
Projekt
Open Access-Veröffentlichung
Open Access Green
Sammlungen
Core Facility der Universität Konstanz
Titel in einer weiteren Sprache
Publikationstyp
Zeitschriftenartikel
Publikationsstatus
Published
Erschienen in
Solid State Phenomena. 2013, 205-206, pp. 136-141. ISSN 0377-6883. eISSN 1662-9779. Available under: doi: 10.4028/www.scientific.net/SSP.205-206.136
Zusammenfassung
To investigate transition metal precipitates in Si, synchrotron based measurements, like micro x-ray fluorescence (μXRF) or detailed transmission electron microscopy (TEM) studies, are usually necessary. Transition metals are among the most detrimental defects in multi-crystalline (mc) silicon material for solar cell applications, due to their impact on minority charge carrier lifetime and possible shunt formation. We present another possibility to investigate transition metal precipitates by 3-dimensional focused ion beam (3D-FIB) cutting using a combined scanning electron microscope (SEM) SEM-FIB-system. This method is able to detect transition metal precipitates down to 5 nm in radius and provides additional information about the 3D shape, size and spatial distribution of the precipitates.
Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
Konferenz
Rezension
undefined / . - undefined, undefined
Zitieren
ISO 690
ZUSCHLAG, Annika, Michail SCHWAB, Dorit MERHOF, Giso HAHN, 2013. Transition metal precipitates in mc Si : a new detection method using 3D-FIB. In: Solid State Phenomena. 2013, 205-206, pp. 136-141. ISSN 0377-6883. eISSN 1662-9779. Available under: doi: 10.4028/www.scientific.net/SSP.205-206.136BibTex
@article{Zuschlag2013Trans-25059,
year={2013},
doi={10.4028/www.scientific.net/SSP.205-206.136},
title={Transition metal precipitates in mc Si : a new detection method using 3D-FIB},
volume={205-206},
issn={0377-6883},
journal={Solid State Phenomena},
pages={136--141},
author={Zuschlag, Annika and Schwab, Michail and Merhof, Dorit and Hahn, Giso}
}RDF
<rdf:RDF
xmlns:dcterms="http://purl.org/dc/terms/"
xmlns:dc="http://purl.org/dc/elements/1.1/"
xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
xmlns:bibo="http://purl.org/ontology/bibo/"
xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
xmlns:foaf="http://xmlns.com/foaf/0.1/"
xmlns:void="http://rdfs.org/ns/void#"
xmlns:xsd="http://www.w3.org/2001/XMLSchema#" >
<rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/25059">
<dcterms:title>Transition metal precipitates in mc Si : a new detection method using 3D-FIB</dcterms:title>
<dc:creator>Merhof, Dorit</dc:creator>
<dc:language>eng</dc:language>
<bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/25059"/>
<dc:contributor>Merhof, Dorit</dc:contributor>
<dcterms:bibliographicCitation>Solid State Phenomena ; (2013), 205-206. - S. 136-141</dcterms:bibliographicCitation>
<dcterms:issued>2013</dcterms:issued>
<dc:contributor>Hahn, Giso</dc:contributor>
<dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2013-11-06T20:34:25Z</dc:date>
<dc:contributor>Schwab, Michail</dc:contributor>
<dc:contributor>Zuschlag, Annika</dc:contributor>
<dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
<dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2013-11-06T20:34:25Z</dcterms:available>
<dc:creator>Zuschlag, Annika</dc:creator>
<dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
<foaf:homepage rdf:resource="http://localhost:8080/"/>
<dcterms:abstract xml:lang="eng">To investigate transition metal precipitates in Si, synchrotron based measurements, like micro x-ray fluorescence (μXRF) or detailed transmission electron microscopy (TEM) studies, are usually necessary. Transition metals are among the most detrimental defects in multi-crystalline (mc) silicon material for solar cell applications, due to their impact on minority charge carrier lifetime and possible shunt formation. We present another possibility to investigate transition metal precipitates by 3-dimensional focused ion beam (3D-FIB) cutting using a combined scanning electron microscope (SEM) SEM-FIB-system. This method is able to detect transition metal precipitates down to 5 nm in radius and provides additional information about the 3D shape, size and spatial distribution of the precipitates.</dcterms:abstract>
<dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
<dc:creator>Hahn, Giso</dc:creator>
<dc:rights>terms-of-use</dc:rights>
<dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/25059/2/Zuschlag_250596.pdf"/>
<dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/25059/2/Zuschlag_250596.pdf"/>
<void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
<dc:creator>Schwab, Michail</dc:creator>
</rdf:Description>
</rdf:RDF>Interner Vermerk
xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter
Prüfungsdatum der Dissertation
Finanzierungsart
Kommentar zur Publikation
Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja
