Current Transport at the Atomic Scale

Kurzanzeige
dc.contributor.authorSchröter, Ursula
dc.contributor.authorScheer, Elke
dc.contributor.authorArnold, Rainerdeu
dc.contributor.authorBacca, Ceciledeu
dc.contributor.authorBöhler, Tobias
dc.contributor.authorGrebing, Jochendeu
dc.contributor.authorKonrad, Patrickdeu
dc.contributor.authorKunej, Vojkodeu
dc.contributor.authorKang, Ningdeu
dc.contributor.authorPernau, Hans
dc.contributor.authorSchirm, Christian
dc.date.accessioned2011-03-24T17:54:41Zdeu
dc.date.available2011-03-24T17:54:41Zdeu
dc.date.issued2005deu
dc.description.abstractElectrical contacts of the width of only one atom can be realized by the break-junction technique. The conductance decreases stepwise due to structural reconfigurations when tearing a nano-bridge in the few-atom range. Transport is described by an ensemble of channels with possibly quite high transmission probabilities. For a single break-junction the last one-atom contact consists of a material-specific channel ensemble, determined by the chemical valance as verified for quite a number of metals. d-electrons in half-metals and spin-effects in magnetic materials will complicate this simple model. Break-junctions also provide ideal contacts to investigate transport through freely suspended clusters or molecules like DNA.eng
dc.description.versionpublished
dc.format.mimetypeapplication/pdfdeu
dc.identifier.citationFirst publ in: Advanced Engineering Materials 7 (2005), 9, pp. 795-803deu
dc.identifier.doi10.1002/adem.200500101
dc.identifier.ppn263662187deu
dc.identifier.urihttp://kops.uni-konstanz.de/handle/123456789/9225
dc.language.isoengdeu
dc.legacy.dateIssued2007deu
dc.rightsAttribution-NonCommercial-NoDerivs 2.0 Generic
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/
dc.subject.ddc530deu
dc.titleCurrent Transport at the Atomic Scaleeng
dc.typeJOURNAL_ARTICLEdeu
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@article{Schroter2005Curre-9225,
  year={2005},
  doi={10.1002/adem.200500101},
  title={Current Transport at the Atomic Scale},
  number={9},
  volume={7},
  issn={1438-1656},
  journal={Advanced Engineering Materials},
  pages={795--803},
  author={Schröter, Ursula and Scheer, Elke and Arnold, Rainer and Bacca, Cecile and Böhler, Tobias and Grebing, Jochen and Konrad, Patrick and Kunej, Vojko and Kang, Ning and Pernau, Hans and Schirm, Christian}
}
kops.citation.iso690SCHRÖTER, Ursula, Elke SCHEER, Rainer ARNOLD, Cecile BACCA, Tobias BÖHLER, Jochen GREBING, Patrick KONRAD, Vojko KUNEJ, Ning KANG, Hans PERNAU, Christian SCHIRM, 2005. Current Transport at the Atomic Scale. In: Advanced Engineering Materials. 2005, 7(9), pp. 795-803. ISSN 1438-1656. eISSN 1527-2648. Available under: doi: 10.1002/adem.200500101deu
kops.citation.iso690SCHRÖTER, Ursula, Elke SCHEER, Rainer ARNOLD, Cecile BACCA, Tobias BÖHLER, Jochen GREBING, Patrick KONRAD, Vojko KUNEJ, Ning KANG, Hans PERNAU, Christian SCHIRM, 2005. Current Transport at the Atomic Scale. In: Advanced Engineering Materials. 2005, 7(9), pp. 795-803. ISSN 1438-1656. eISSN 1527-2648. Available under: doi: 10.1002/adem.200500101eng
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