Detection of Fermi arcs in Weyl semimetals through surface negative refraction

dc.contributor.authorChen, Guangze
dc.contributor.authorZilberberg, Oded
dc.contributor.authorChen, Wei
dc.date.accessioned2021-09-21T07:34:21Z
dc.date.available2021-09-21T07:34:21Z
dc.date.issued2020eng
dc.description.abstractOne of the main features of Weyl semimetals is the existence of Fermi arc surface states at their surface, which cannot be realized in pure two-dimensional systems in the absence of many-body interactions. Due to the gapless bulk of the semimetal, it is, however, challenging to observe clear signatures from the Fermi arc surface states. Here, we propose to detect such novel surface states via perfect negative refraction that occurs between two adjacent open surfaces with properly orientated Fermi arcs. Specifically, this phenomenon visibly manifests in non-local transport measurement, where the negative refraction generates a return peak in the real-space conductance. This provides a unique signature of the Fermi arc surface states. We discuss the appearance of this peak both in inversion and time-reversal symmetric Weyl semimetals, where the latter exhibits conductance oscillations due to multiple negative refraction scattering events.eng
dc.description.versionpublishedeng
dc.identifier.arxiv1911.04941v2eng
dc.identifier.doi10.1103/PhysRevB.101.125407eng
dc.identifier.urihttps://kops.uni-konstanz.de/handle/123456789/54905
dc.language.isoengeng
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dc.subject.ddc530eng
dc.titleDetection of Fermi arcs in Weyl semimetals through surface negative refractioneng
dc.typeJOURNAL_ARTICLEeng
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@article{Chen2020Detec-54905,
  year={2020},
  doi={10.1103/PhysRevB.101.125407},
  title={Detection of Fermi arcs in Weyl semimetals through surface negative refraction},
  number={12},
  volume={101},
  issn={2469-9950},
  journal={Physical Review B},
  author={Chen, Guangze and Zilberberg, Oded and Chen, Wei},
  note={Article Number: 125407}
}
kops.citation.iso690CHEN, Guangze, Oded ZILBERBERG, Wei CHEN, 2020. Detection of Fermi arcs in Weyl semimetals through surface negative refraction. In: Physical Review B. American Physical Society (APS). 2020, 101(12), 125407. ISSN 2469-9950. eISSN 2469-9969. Available under: doi: 10.1103/PhysRevB.101.125407deu
kops.citation.iso690CHEN, Guangze, Oded ZILBERBERG, Wei CHEN, 2020. Detection of Fermi arcs in Weyl semimetals through surface negative refraction. In: Physical Review B. American Physical Society (APS). 2020, 101(12), 125407. ISSN 2469-9950. eISSN 2469-9969. Available under: doi: 10.1103/PhysRevB.101.125407eng
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kops.sourcefieldPhysical Review B. American Physical Society (APS). 2020, <b>101</b>(12), 125407. ISSN 2469-9950. eISSN 2469-9969. Available under: doi: 10.1103/PhysRevB.101.125407deu
kops.sourcefield.plainPhysical Review B. American Physical Society (APS). 2020, 101(12), 125407. ISSN 2469-9950. eISSN 2469-9969. Available under: doi: 10.1103/PhysRevB.101.125407deu
kops.sourcefield.plainPhysical Review B. American Physical Society (APS). 2020, 101(12), 125407. ISSN 2469-9950. eISSN 2469-9969. Available under: doi: 10.1103/PhysRevB.101.125407eng
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source.periodicalTitlePhysical Review Beng
source.publisherAmerican Physical Society (APS)eng

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