Controlled electromigration and oxidation of free-standing copper wires

Kurzanzeige
dc.contributor.authorHauser, Julia S.
dc.contributor.authorSchwichtenberg, Jakob
dc.contributor.authorMarz, Michael
dc.contributor.authorSürgers, Christoph
dc.contributor.authorSeiler, Arnold
dc.contributor.authorGerhards, Uta
dc.contributor.authorMesserschmidt, Florian
dc.contributor.authorHensel, Andreas
dc.contributor.authorDittmeyer, Roland
dc.contributor.authorLöhneysen, Hilbert von
dc.contributor.authorHoffmann-Vogel, Regina
dc.date.accessioned2019-03-04T14:47:41Z
dc.date.available2019-03-04T14:47:41Z
dc.date.issued2016-12-01eng
dc.description.abstractWe have studied controlled electromigration (EM) in free-standing copper wires. Besides electrical characterization by voltage–current measurements, structural analyses have been performed by means of scanning electron microscopy and cross-sectional microprobe measurements. We have found that oxidation during the EM in air stabilizes the free-standing wire against uncontrolled blowing, making it possible to thin the conductive part of the wire down to a conductance of a few conductance quanta G0=2e2/h. The decisive influence of oxidation by air on the EM process was confirmed by control experiments performed under ultra-high vacuum conditions. In line with these findings, free-standing Au wires were difficult to thin down reproducibly to a conductance of a few G0. Estimates of the local temperature in the free-standing wire are obtained from finite element method calculations.eng
dc.description.versionpublishedeng
dc.identifier.doi10.1007/s00339-016-0600-zeng
dc.identifier.ppn51835766X
dc.identifier.urihttps://kops.uni-konstanz.de/handle/123456789/45291
dc.language.isoengeng
dc.rightsterms-of-use
dc.rights.urihttps://rightsstatements.org/page/InC/1.0/
dc.subject.ddc530eng
dc.titleControlled electromigration and oxidation of free-standing copper wireseng
dc.typeJOURNAL_ARTICLEeng
dspace.entity.typePublication
kops.citation.bibtex
@article{Hauser2016-12-01Contr-45291,
  year={2016},
  doi={10.1007/s00339-016-0600-z},
  title={Controlled electromigration and oxidation of free-standing copper wires},
  number={12},
  volume={122},
  issn={0947-8396},
  journal={Applied Physics A},
  author={Hauser, Julia S. and Schwichtenberg, Jakob and Marz, Michael and Sürgers, Christoph and Seiler, Arnold and Gerhards, Uta and Messerschmidt, Florian and Hensel, Andreas and Dittmeyer, Roland and Löhneysen, Hilbert von and Hoffmann-Vogel, Regina},
  note={Article Number: 1068}
}
kops.citation.iso690HAUSER, Julia S., Jakob SCHWICHTENBERG, Michael MARZ, Christoph SÜRGERS, Arnold SEILER, Uta GERHARDS, Florian MESSERSCHMIDT, Andreas HENSEL, Roland DITTMEYER, Hilbert von LÖHNEYSEN, Regina HOFFMANN-VOGEL, 2016. Controlled electromigration and oxidation of free-standing copper wires. In: Applied Physics A. 2016, 122(12), 1068. ISSN 0947-8396. eISSN 1432-0630. Available under: doi: 10.1007/s00339-016-0600-zdeu
kops.citation.iso690HAUSER, Julia S., Jakob SCHWICHTENBERG, Michael MARZ, Christoph SÜRGERS, Arnold SEILER, Uta GERHARDS, Florian MESSERSCHMIDT, Andreas HENSEL, Roland DITTMEYER, Hilbert von LÖHNEYSEN, Regina HOFFMANN-VOGEL, 2016. Controlled electromigration and oxidation of free-standing copper wires. In: Applied Physics A. 2016, 122(12), 1068. ISSN 0947-8396. eISSN 1432-0630. Available under: doi: 10.1007/s00339-016-0600-zeng
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kops.sourcefieldApplied Physics A. 2016, <b>122</b>(12), 1068. ISSN 0947-8396. eISSN 1432-0630. Available under: doi: 10.1007/s00339-016-0600-zdeu
kops.sourcefield.plainApplied Physics A. 2016, 122(12), 1068. ISSN 0947-8396. eISSN 1432-0630. Available under: doi: 10.1007/s00339-016-0600-zdeu
kops.sourcefield.plainApplied Physics A. 2016, 122(12), 1068. ISSN 0947-8396. eISSN 1432-0630. Available under: doi: 10.1007/s00339-016-0600-zeng
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source.periodicalTitleApplied Physics Aeng

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