Publikation: Contact phenomena in 2D electron systems
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1998
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Physica / B [Condensed Matter]. 1998, 249-251, pp. 660-663. Available under: doi: 10.1016/S0921-4526(98)00283-X
Zusammenfassung
A promising way ro investigate 2D contact phenomena is proposed. This method is based on the idea of depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid sample containing a 2D-charge carrier system. The density of SSE adjusts to screen contact-induced perturbations or the electrostatic potential across the sample. As a result, the helium layer thickness varies due to the variation of the electrostatic pressure, thus providing a map. This map may be read off interferometrically by a technique already employed for the investigation of multi-electron dimples on helium. We have realized this mapping for a structured electrode as a test sample to dcnmonstrate the resolution of the method.
Zusammenfassung in einer weiteren Sprache
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530 Physik
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Liquid helium, contact phenomena
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SHIKIN, Valeri, Ekkehard TESKE, Paul LEIDERER, Peter WYDER, 1998. Contact phenomena in 2D electron systems. In: Physica / B [Condensed Matter]. 1998, 249-251, pp. 660-663. Available under: doi: 10.1016/S0921-4526(98)00283-XBibTex
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year={1998},
doi={10.1016/S0921-4526(98)00283-X},
title={Contact phenomena in 2D electron systems},
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pages={660--663},
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<dcterms:abstract xml:lang="eng">A promising way ro investigate 2D contact phenomena is proposed. This method is based on the idea of depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid sample containing a 2D-charge carrier system. The density of SSE adjusts to screen contact-induced perturbations or the electrostatic potential across the sample. As a result, the helium layer thickness varies due to the variation of the electrostatic pressure, thus providing a map. This map may be read off interferometrically by a technique already employed for the investigation of multi-electron dimples on helium. We have realized this mapping for a structured electrode as a test sample to dcnmonstrate the resolution of the method.</dcterms:abstract>
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