Publikation:

Effects of process conditions for the n+-emitter formation in crystalline silicon

Lade...
Vorschaubild

Dateien

Dastgheib-Shirazi_224955.pdf
Dastgheib-Shirazi_224955.pdfGröße: 247.86 KBDownloads: 415

Datum

2012

Autor:innen

Herausgeber:innen

Kontakt

ISSN der Zeitschrift

Electronic ISSN

ISBN

Bibliografische Daten

Verlag

Schriftenreihe

Auflagebezeichnung

ArXiv-ID

Internationale Patentnummer

Angaben zur Forschungsförderung

Projekt

Open Access-Veröffentlichung
Open Access Green
Core Facility der Universität Konstanz

Gesperrt bis

Titel in einer weiteren Sprache

Publikationstyp
Beitrag zu einem Konferenzband
Publikationsstatus
Published

Erschienen in

2012 38th IEEE Photovoltaic Specialists Conference. IEEE, 2012, pp. 001584-001589. ISBN 978-1-4673-0064-3. Available under: doi: 10.1109/PVSC.2012.6317897

Zusammenfassung

Nowadays new solar cell concepts are continually attracting the attention of the PV industry. Thereby emitter structures and the application of high performance emitters like the homogeneous and etched-back emitter on crystalline p- and n-type silicon solar cells continue to be very popular [1]-[4]. In this work we study the influence of process parameters on the phosphosilicate glass layer characteristics during the predeposition of a POCl3 diffusion process. The quantitative analysis of the highly doped layer gives a deeper understanding of the phosphorus diffusion process for industrial emitter structures.

Zusammenfassung in einer weiteren Sprache

Fachgebiet (DDC)
530 Physik

Schlagwörter

Konferenz

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC), 3. Juni 2012 - 8. Juni 2012, Austin, TX, USA
Rezension
undefined / . - undefined, undefined

Forschungsvorhaben

Organisationseinheiten

Zeitschriftenheft

Zugehörige Datensätze in KOPS

Zitieren

ISO 690DASTGHEIB-SHIRAZI, Amir, Michael STEYER, Gabriel MICARD, Hannes WAGNER, Pietro ALTERMATT, Giso HAHN, 2012. Effects of process conditions for the n+-emitter formation in crystalline silicon. 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC). Austin, TX, USA, 3. Juni 2012 - 8. Juni 2012. In: 2012 38th IEEE Photovoltaic Specialists Conference. IEEE, 2012, pp. 001584-001589. ISBN 978-1-4673-0064-3. Available under: doi: 10.1109/PVSC.2012.6317897
BibTex
@inproceedings{DastgheibShirazi2012-06Effec-22495,
  year={2012},
  doi={10.1109/PVSC.2012.6317897},
  title={Effects of process conditions for the n<sup>+</sup>-emitter formation in crystalline silicon},
  isbn={978-1-4673-0064-3},
  publisher={IEEE},
  booktitle={2012 38th IEEE Photovoltaic Specialists Conference},
  pages={001584--001589},
  author={Dastgheib-Shirazi, Amir and Steyer, Michael and Micard, Gabriel and Wagner, Hannes and Altermatt, Pietro and Hahn, Giso}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/22495">
    <dc:creator>Wagner, Hannes</dc:creator>
    <dc:creator>Micard, Gabriel</dc:creator>
    <dc:creator>Altermatt, Pietro</dc:creator>
    <dc:contributor>Micard, Gabriel</dc:contributor>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/22495/2/Dastgheib-Shirazi_224955.pdf"/>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:rights>terms-of-use</dc:rights>
    <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
    <dc:contributor>Wagner, Hannes</dc:contributor>
    <dc:language>eng</dc:language>
    <dcterms:issued>2012-06</dcterms:issued>
    <dc:creator>Dastgheib-Shirazi, Amir</dc:creator>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dcterms:bibliographicCitation>38th IEEE Photovoltaic Specialists Conference (PVSC) 2012 : Austin, Texas, USA, 3 - 8 June 2012 / [IEEE Electron Devices Society]. - Piscataway, NJ : IEEE, 2012. - S. 1584-1589. - ISBN 978-1-467-30064-3</dcterms:bibliographicCitation>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/22495"/>
    <dcterms:abstract xml:lang="eng">Nowadays new solar cell concepts are continually attracting the attention of the PV industry. Thereby emitter structures and the application of high performance emitters like the homogeneous and etched-back emitter on crystalline p- and n-type silicon solar cells continue to be very popular [1]-[4]. In this work we study the influence of process parameters on the phosphosilicate glass layer characteristics during the predeposition of a POCl&lt;sub&gt;3&lt;/sub&gt; diffusion process. The quantitative analysis of the highly doped layer gives a deeper understanding of the phosphorus diffusion process for industrial emitter structures.</dcterms:abstract>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/22495/2/Dastgheib-Shirazi_224955.pdf"/>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dc:contributor>Steyer, Michael</dc:contributor>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2013-03-28T12:56:37Z</dcterms:available>
    <dc:contributor>Dastgheib-Shirazi, Amir</dc:contributor>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2013-03-28T12:56:37Z</dc:date>
    <dc:contributor>Hahn, Giso</dc:contributor>
    <dcterms:title>Effects of process conditions for the n&lt;sup&gt;+&lt;/sup&gt;-emitter formation in crystalline silicon</dcterms:title>
    <dc:contributor>Altermatt, Pietro</dc:contributor>
    <dc:creator>Steyer, Michael</dc:creator>
    <dc:creator>Hahn, Giso</dc:creator>
  </rdf:Description>
</rdf:RDF>

Interner Vermerk

xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter

Kontakt
URL der Originalveröffentl.

Prüfdatum der URL

Prüfungsdatum der Dissertation

Finanzierungsart

Kommentar zur Publikation

Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja
Begutachtet
Diese Publikation teilen