Two dimensional resolution of minority carrier diffusion constants in different silicon materials

Sontag, Detlef; Hahn, Giso; Geiger, Patric; Fath, Peter; Bucher, Ernst

Two dimensional resolution of minority carrier diffusion constants in different silicon materials

Dateien

Sontag_2-1gy80k94e0huc4.pdfGröße: 217.51 KBDownloads: 293

Datum

2002

Autor:innen

Sontag, Detlef

Hahn, Giso

Geiger, Patric

Fath, Peter

Bucher, Ernst

Publikationstyp

Zeitschriftenartikel

Publikationsstatus

Published

Erschienen in

Solar Energy Materials and Solar Cells. 2002, 72(1-4), pp. 533-539. ISSN 0927-0248. eISSN 1879-3398. Available under: doi: 10.1016/S0927-0248(01)00202-1

Fachgebiet (DDC)

530 Physik

Zitieren

ISO 690

SONTAG, Detlef, Giso HAHN, Patric GEIGER, Peter FATH, Ernst BUCHER, 2002. Two dimensional resolution of minority carrier diffusion constants in different silicon materials. In: Solar Energy Materials and Solar Cells. 2002, 72(1-4), pp. 533-539. ISSN 0927-0248. eISSN 1879-3398. Available under: doi: 10.1016/S0927-0248(01)00202-1

BibTex

@article{Sontag2002dimen-30935,
  year={2002},
  doi={10.1016/S0927-0248(01)00202-1},
  title={Two dimensional resolution of minority carrier diffusion constants in different silicon materials},
  number={1-4},
  volume={72},
  issn={0927-0248},
  journal={Solar Energy Materials and Solar Cells},
  pages={533--539},
  author={Sontag, Detlef and Hahn, Giso and Geiger, Patric and Fath, Peter and Bucher, Ernst}
}

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