Effect of Al Concentration Analyzed by ICP-OES on the Structural, Electrical and Optical Properties of Co-sputtered ZnO:Al Films
| dc.contributor.author | Gorgulla, Angelika | |
| dc.contributor.author | Ertel, Dominik P. | |
| dc.contributor.author | Steyer, Michael | |
| dc.contributor.author | Hahn, Giso | |
| dc.contributor.author | Terheiden, Barbara | |
| dc.date.accessioned | 2015-11-03T10:33:36Z | |
| dc.date.available | 2015-11-03T10:33:36Z | |
| dc.date.issued | 2015 | eng |
| dc.description.version | published | |
| dc.identifier.doi | 10.1016/j.egypro.2015.07.098 | eng |
| dc.identifier.ppn | 459364588 | |
| dc.identifier.uri | http://kops.uni-konstanz.de/handle/123456789/32045 | |
| dc.language.iso | eng | eng |
| dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 International | |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | |
| dc.subject.ddc | 530 | eng |
| dc.title | Effect of Al Concentration Analyzed by ICP-OES on the Structural, Electrical and Optical Properties of Co-sputtered ZnO:Al Films | eng |
| dc.type | JOURNAL_ARTICLE | eng |
| dspace.entity.type | Publication | |
| kops.citation.bibtex | @article{Gorgulla2015Effec-32045,
year={2015},
doi={10.1016/j.egypro.2015.07.098},
title={Effect of Al Concentration Analyzed by ICP-OES on the Structural, Electrical and Optical Properties of Co-sputtered ZnO:Al Films},
volume={77},
journal={Energy Procedia},
pages={687--693},
author={Gorgulla, Angelika and Ertel, Dominik P. and Steyer, Michael and Hahn, Giso and Terheiden, Barbara}
} | |
| kops.citation.iso690 | GORGULLA, Angelika, Dominik P. ERTEL, Michael STEYER, Giso HAHN, Barbara TERHEIDEN, 2015. Effect of Al Concentration Analyzed by ICP-OES on the Structural, Electrical and Optical Properties of Co-sputtered ZnO:Al Films. In: Energy Procedia. 2015, 77, pp. 687-693. eISSN 1876-6102. Available under: doi: 10.1016/j.egypro.2015.07.098 | deu |
| kops.citation.iso690 | GORGULLA, Angelika, Dominik P. ERTEL, Michael STEYER, Giso HAHN, Barbara TERHEIDEN, 2015. Effect of Al Concentration Analyzed by ICP-OES on the Structural, Electrical and Optical Properties of Co-sputtered ZnO:Al Films. In: Energy Procedia. 2015, 77, pp. 687-693. eISSN 1876-6102. Available under: doi: 10.1016/j.egypro.2015.07.098 | eng |
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| temp.internal.duplicates | <p>Keine Dubletten gefunden. Letzte Überprüfung: 26.10.2015 11:36:15</p> | deu |
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