Publikation: Progress in mechanically shuttered time-resolved photoluminescence imaging of silicon wafers
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Recently two approaches to extend the photoluminescence imaging (PLI) technique by evaluating the dynamic properties of the sample have been presented. Time-resolved photoluminescence measurements may provide calibration-free maps of the effective minority charge carrier lifetime in silicon wafers. Due to the transient measurement they minimize errors due to lateral inhomogeneities in setup or sample, which would usually contribute linearly to steady-state PLI measurements. In this work, we will focus on mechanically shuttered time-resolved photoluminescence imaging (TR-PLI), as it provides a high measurement range down to 5 μs at low hardware costs.
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KILIANI, David, Gabriel MICARD, Axel HERGUTH, Giso HAHN, 2011. Progress in mechanically shuttered time-resolved photoluminescence imaging of silicon wafers. 26th European Photovoltaic Solar Energy Conference and Exhibition. Hamburg, Germany, 5. Sept. 2011 - 9. Sept. 2011. In: OSSENBRINK, H., ed. and others. Proceedings of the 26th European Photovoltaic Solar Energy Conference and Exhibition : the most inspiring platform for the global PV solar sector. Munich, Germany: WIP-Renewable Energies, 2011, pp. 1463-1466. ISBN 3-936338-27-2. Available under: doi: 10.4229/26thEUPVSEC2011-2BV.2.20BibTex
@inproceedings{Kiliani2011Progr-19205, year={2011}, doi={10.4229/26thEUPVSEC2011-2BV.2.20}, title={Progress in mechanically shuttered time-resolved photoluminescence imaging of silicon wafers}, isbn={3-936338-27-2}, publisher={WIP-Renewable Energies}, address={Munich, Germany}, booktitle={Proceedings of the 26th European Photovoltaic Solar Energy Conference and Exhibition : the most inspiring platform for the global PV solar sector}, pages={1463--1466}, editor={Ossenbrink, H.}, author={Kiliani, David and Micard, Gabriel and Herguth, Axel and Hahn, Giso} }
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