Publikation: Real-time electron clustering in an event-driven hybrid pixel detector
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Event-driven hybrid pixel detectors with nanosecond time resolution have opened up novel pathways in modern ultrafast electron microscopy, for example in hyperspectral electron-energy loss spectroscopy or free-electron quantum optics. However, the impinging electrons typically excite more than one pixel of the device, and an efficient algorithm is therefore needed to convert the measured pixel hits to real single-electron events. Here we present a robust clustering algorithm that is fast enough to find clusters in a continuous stream of raw data in real time. Each tuple of position and arrival time from the detector is continuously compared to a buffer of previous hits until the probability of a merger with an old event becomes irrelevant. In this way, the computation time becomes independent of the density of electron arrival and the algorithm does not break the operation chain. We showcase the performance of the algorithm with a ‘timepix’ camera in two regimes of electron microscopy, in continuous beam emission and laser-triggered femtosecond mode.
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KUTTRUFF, Joel, Jacob HOLDER, Yenan MENG, Peter BAUM, 2024. Real-time electron clustering in an event-driven hybrid pixel detector. In: Ultramicroscopy. Elsevier. 2024, 255, 113864. ISSN 0304-3991. eISSN 1879-2723. Available under: doi: 10.1016/j.ultramic.2023.113864BibTex
@article{Kuttruff2024Realt-68429, year={2024}, doi={10.1016/j.ultramic.2023.113864}, title={Real-time electron clustering in an event-driven hybrid pixel detector}, volume={255}, issn={0304-3991}, journal={Ultramicroscopy}, author={Kuttruff, Joel and Holder, Jacob and Meng, Yenan and Baum, Peter}, note={Article Number: 113864} }
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<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/68429"> <dc:contributor>Meng, Yenan</dc:contributor> <dc:contributor>Holder, Jacob</dc:contributor> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:contributor>Baum, Peter</dc:contributor> <dcterms:title>Real-time electron clustering in an event-driven hybrid pixel detector</dcterms:title> <dcterms:abstract>Event-driven hybrid pixel detectors with nanosecond time resolution have opened up novel pathways in modern ultrafast electron microscopy, for example in hyperspectral electron-energy loss spectroscopy or free-electron quantum optics. However, the impinging electrons typically excite more than one pixel of the device, and an efficient algorithm is therefore needed to convert the measured pixel hits to real single-electron events. Here we present a robust clustering algorithm that is fast enough to find clusters in a continuous stream of raw data in real time. Each tuple of position and arrival time from the detector is continuously compared to a buffer of previous hits until the probability of a merger with an old event becomes irrelevant. In this way, the computation time becomes independent of the density of electron arrival and the algorithm does not break the operation chain. We showcase the performance of the algorithm with a ‘timepix’ camera in two regimes of electron microscopy, in continuous beam emission and laser-triggered femtosecond mode.</dcterms:abstract> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/> <dc:language>eng</dc:language> <dc:contributor>Kuttruff, Joel</dc:contributor> <dc:creator>Baum, Peter</dc:creator> <dc:creator>Meng, Yenan</dc:creator> <dc:creator>Kuttruff, Joel</dc:creator> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/> <dcterms:issued>2024</dcterms:issued> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2023-11-24T11:30:35Z</dc:date> <foaf:homepage rdf:resource="http://localhost:8080/"/> <dc:creator>Holder, Jacob</dc:creator> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2023-11-24T11:30:35Z</dcterms:available> <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/68429"/> </rdf:Description> </rdf:RDF>