SMARTexplore : Simplifying High-Dimensional Data Analysis through a Table-Based Visual Analytics Approach
| dc.contributor.author | Blumenschein, Michael | |
| dc.contributor.author | Behrisch, Michael | |
| dc.contributor.author | Schmid, Stefanie | |
| dc.contributor.author | Butscher, Simon | |
| dc.contributor.author | Wahl, Deborah R. | |
| dc.contributor.author | Villinger, Karoline | |
| dc.contributor.author | Renner, Britta | |
| dc.contributor.author | Reiterer, Harald | |
| dc.contributor.author | Keim, Daniel A. | |
| dc.date.accessioned | 2018-10-18T13:58:29Z | |
| dc.date.available | 2018-10-18T13:58:29Z | |
| dc.date.issued | 2019 | eng |
| dc.description.abstract | We present SMARTEXPLORE, a novel visual analytics technique that simplifies the identification and understanding of clusters, correlations, and complex patterns in high-dimensional data. The analysis is integrated into an interactive table-based visualization that maintains a consistent and familiar representation throughout the analysis. The visualization is tightly coupled with pattern matching, subspace analysis, reordering, and layout algorithms. To increase the analyst’s trust in the revealed patterns, SMARTEXPLORE automatically selects and computes statistical measures based on dimension and data properties. While existing approaches to analyzing highdimensional data (e.g., planar projections and Parallel coordinates) have proven effective, they typically have steep learning curves for non-visualization experts. Our evaluation, based on three expert case studies, confirms that non-visualization experts successfully reveal patterns in high-dimensional data when using SMARTEXPLORE. | eng |
| dc.description.version | published | eng |
| dc.identifier.doi | 10.1109/VAST.2018.8802486 | |
| dc.identifier.ppn | 512310610 | |
| dc.identifier.uri | https://kops.uni-konstanz.de/handle/123456789/43582 | |
| dc.language.iso | eng | eng |
| dc.rights | terms-of-use | |
| dc.rights.uri | https://rightsstatements.org/page/InC/1.0/ | |
| dc.subject | High-dimensional data, visual exploration, patterndriven analysis, tabular visualization, subspace, aggregation | eng |
| dc.subject.ddc | 004 | eng |
| dc.title | SMARTexplore : Simplifying High-Dimensional Data Analysis through a Table-Based Visual Analytics Approach | eng |
| dc.type | INPROCEEDINGS | eng |
| dspace.entity.type | Publication | |
| kops.citation.bibtex | @inproceedings{Blumenschein2019SMART-43582,
year={2019},
doi={10.1109/VAST.2018.8802486},
title={SMARTexplore : Simplifying High-Dimensional Data Analysis through a Table-Based Visual Analytics Approach},
isbn={978-1-5386-6861-0},
publisher={IEEE},
address={Piscataway, NJ},
booktitle={IEEE Conference on Visual Analytics Science and Technology (VAST) 2018},
author={Blumenschein, Michael and Behrisch, Michael and Schmid, Stefanie and Butscher, Simon and Wahl, Deborah R. and Villinger, Karoline and Renner, Britta and Reiterer, Harald and Keim, Daniel A.}
} | |
| kops.citation.iso690 | BLUMENSCHEIN, Michael, Michael BEHRISCH, Stefanie SCHMID, Simon BUTSCHER, Deborah R. WAHL, Karoline VILLINGER, Britta RENNER, Harald REITERER, Daniel A. KEIM, 2019. SMARTexplore : Simplifying High-Dimensional Data Analysis through a Table-Based Visual Analytics Approach. IEEE Conference on Visual Analytics Science and Technology (VAST) 2018. Berlin, Germany, 21. Okt. 2018 - 26. Okt. 2018. In: IEEE Conference on Visual Analytics Science and Technology (VAST) 2018. Piscataway, NJ: IEEE, 2019. ISBN 978-1-5386-6861-0. Available under: doi: 10.1109/VAST.2018.8802486 | deu |
| kops.citation.iso690 | BLUMENSCHEIN, Michael, Michael BEHRISCH, Stefanie SCHMID, Simon BUTSCHER, Deborah R. WAHL, Karoline VILLINGER, Britta RENNER, Harald REITERER, Daniel A. KEIM, 2019. SMARTexplore : Simplifying High-Dimensional Data Analysis through a Table-Based Visual Analytics Approach. IEEE Conference on Visual Analytics Science and Technology (VAST) 2018. Berlin, Germany, Oct 21, 2018 - Oct 26, 2018. In: IEEE Conference on Visual Analytics Science and Technology (VAST) 2018. Piscataway, NJ: IEEE, 2019. ISBN 978-1-5386-6861-0. Available under: doi: 10.1109/VAST.2018.8802486 | eng |
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| kops.conferencefield | IEEE Conference on Visual Analytics Science and Technology (VAST) 2018, 21. Okt. 2018 - 26. Okt. 2018, Berlin, Germany | deu |
| kops.date.conferenceEnd | 2018-10-26 | eng |
| kops.date.conferenceStart | 2018-10-21 | eng |
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| kops.location.conference | Berlin, Germany | eng |
| kops.relation.uniknProjectTitle | SFB TRR 161 TP C 01 Quantitative Messung von Interaktion | |
| kops.sourcefield | <i>IEEE Conference on Visual Analytics Science and Technology (VAST) 2018</i>. Piscataway, NJ: IEEE, 2019. ISBN 978-1-5386-6861-0. Available under: doi: 10.1109/VAST.2018.8802486 | deu |
| kops.sourcefield.plain | IEEE Conference on Visual Analytics Science and Technology (VAST) 2018. Piscataway, NJ: IEEE, 2019. ISBN 978-1-5386-6861-0. Available under: doi: 10.1109/VAST.2018.8802486 | deu |
| kops.sourcefield.plain | IEEE Conference on Visual Analytics Science and Technology (VAST) 2018. Piscataway, NJ: IEEE, 2019. ISBN 978-1-5386-6861-0. Available under: doi: 10.1109/VAST.2018.8802486 | eng |
| kops.title.conference | IEEE Conference on Visual Analytics Science and Technology (VAST) 2018 | eng |
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| source.title | IEEE Conference on Visual Analytics Science and Technology (VAST) 2018 | eng |
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