Anomalous Hall effect in YIG|Pt bilayers

dc.contributor.authorMeyer, Sibylle
dc.contributor.authorSchlitz, Richard
dc.contributor.authorGeprägs, Stephan
dc.contributor.authorOpel, Matthias
dc.contributor.authorHuebl, Hans
dc.contributor.authorGross, Rudolf
dc.contributor.authorGoennenwein, Sebastian T. B.
dc.date.accessioned2021-01-14T12:30:12Z
dc.date.available2021-01-14T12:30:12Z
dc.date.issued2015-01-12T09:16:54Zeng
dc.description.versionpublishedeng
dc.identifier.arxiv1501.02574v3eng
dc.identifier.doi10.1063/1.4916342eng
dc.identifier.urihttps://kops.uni-konstanz.de/handle/123456789/52421
dc.language.isoengeng
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dc.subject.ddc530eng
dc.titleAnomalous Hall effect in YIG|Pt bilayerseng
dc.typeJOURNAL_ARTICLEeng
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@article{Meyer2015-01-12T09:16:54ZAnoma-52421,
  year={2015},
  doi={10.1063/1.4916342},
  title={Anomalous Hall effect in YIG|Pt bilayers},
  number={13},
  volume={106},
  issn={0003-6951},
  journal={Applied Physics Letters},
  author={Meyer, Sibylle and Schlitz, Richard and Geprägs, Stephan and Opel, Matthias and Huebl, Hans and Gross, Rudolf and Goennenwein, Sebastian T. B.},
  note={Article Number: 132402}
}
kops.citation.iso690MEYER, Sibylle, Richard SCHLITZ, Stephan GEPRÄGS, Matthias OPEL, Hans HUEBL, Rudolf GROSS, Sebastian T. B. GOENNENWEIN, 2015. Anomalous Hall effect in YIG|Pt bilayers. In: Applied Physics Letters. American Institute of Physics (AIP). 2015, 106(13), 132402. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.4916342deu
kops.citation.iso690MEYER, Sibylle, Richard SCHLITZ, Stephan GEPRÄGS, Matthias OPEL, Hans HUEBL, Rudolf GROSS, Sebastian T. B. GOENNENWEIN, 2015. Anomalous Hall effect in YIG|Pt bilayers. In: Applied Physics Letters. American Institute of Physics (AIP). 2015, 106(13), 132402. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.4916342eng
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kops.sourcefieldApplied Physics Letters. American Institute of Physics (AIP). 2015, <b>106</b>(13), 132402. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.4916342deu
kops.sourcefield.plainApplied Physics Letters. American Institute of Physics (AIP). 2015, 106(13), 132402. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.4916342deu
kops.sourcefield.plainApplied Physics Letters. American Institute of Physics (AIP). 2015, 106(13), 132402. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.4916342eng
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