Anomalous Hall effect in YIG|Pt bilayers
| dc.contributor.author | Meyer, Sibylle | |
| dc.contributor.author | Schlitz, Richard | |
| dc.contributor.author | Geprägs, Stephan | |
| dc.contributor.author | Opel, Matthias | |
| dc.contributor.author | Huebl, Hans | |
| dc.contributor.author | Gross, Rudolf | |
| dc.contributor.author | Goennenwein, Sebastian T. B. | |
| dc.date.accessioned | 2021-01-14T12:30:12Z | |
| dc.date.available | 2021-01-14T12:30:12Z | |
| dc.date.issued | 2015-01-12T09:16:54Z | eng |
| dc.description.version | published | eng |
| dc.identifier.arxiv | 1501.02574v3 | eng |
| dc.identifier.doi | 10.1063/1.4916342 | eng |
| dc.identifier.uri | https://kops.uni-konstanz.de/handle/123456789/52421 | |
| dc.language.iso | eng | eng |
| dc.rights | terms-of-use | |
| dc.rights.uri | https://rightsstatements.org/page/InC/1.0/ | |
| dc.subject.ddc | 530 | eng |
| dc.title | Anomalous Hall effect in YIG|Pt bilayers | eng |
| dc.type | JOURNAL_ARTICLE | eng |
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| kops.citation.bibtex | @article{Meyer2015-01-12T09:16:54ZAnoma-52421,
year={2015},
doi={10.1063/1.4916342},
title={Anomalous Hall effect in YIG|Pt bilayers},
number={13},
volume={106},
issn={0003-6951},
journal={Applied Physics Letters},
author={Meyer, Sibylle and Schlitz, Richard and Geprägs, Stephan and Opel, Matthias and Huebl, Hans and Gross, Rudolf and Goennenwein, Sebastian T. B.},
note={Article Number: 132402}
} | |
| kops.citation.iso690 | MEYER, Sibylle, Richard SCHLITZ, Stephan GEPRÄGS, Matthias OPEL, Hans HUEBL, Rudolf GROSS, Sebastian T. B. GOENNENWEIN, 2015. Anomalous Hall effect in YIG|Pt bilayers. In: Applied Physics Letters. American Institute of Physics (AIP). 2015, 106(13), 132402. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.4916342 | deu |
| kops.citation.iso690 | MEYER, Sibylle, Richard SCHLITZ, Stephan GEPRÄGS, Matthias OPEL, Hans HUEBL, Rudolf GROSS, Sebastian T. B. GOENNENWEIN, 2015. Anomalous Hall effect in YIG|Pt bilayers. In: Applied Physics Letters. American Institute of Physics (AIP). 2015, 106(13), 132402. ISSN 0003-6951. eISSN 1077-3118. Available under: doi: 10.1063/1.4916342 | eng |
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