Capturing atomic-scale carrier dynamics with electrons
| dc.contributor.author | Baum, Peter | |
| dc.contributor.author | Krausz, Ferenc | |
| dc.date.accessioned | 2018-09-13T09:29:00Z | |
| dc.date.available | 2018-09-13T09:29:00Z | |
| dc.date.issued | 2017-09 | eng |
| dc.description.abstract | Light-driven electronic motion unfolds on times as short as the cycle period of light and on length scales as small as the distance between two neighboring atoms in a molecule. Visualizing fundamental light-matter interactions therefore requires access to attosecond and picometer dimensions. Here we report on a potential unification of electron diffraction and microscopy with attosecond technology, which could provide a full space-time access to elementary electronic processes in matter and materials. We review recent progress in ultrafast diffraction and microscopy towards temporal resolutions approaching 10 fs by use of state-of-the-art microwave technology and discuss our latest findings on all-optical compression approaches for reaching sub-femtosecond, sub-optical-cycle resolution. Four-dimensional electron diffraction with attosecond-picometer resolution will access all dynamics outside the atomic core, offering an all-embracing insight into fundamental electron-nuclear dynamics of complex materials. | eng |
| dc.description.version | published | de |
| dc.identifier.doi | 10.1016/j.cplett.2017.03.073 | eng |
| dc.identifier.ppn | 1741210569 | |
| dc.identifier.uri | https://kops.uni-konstanz.de/handle/123456789/43254 | |
| dc.language.iso | eng | eng |
| dc.rights | terms-of-use | |
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| dc.subject.ddc | 530 | eng |
| dc.title | Capturing atomic-scale carrier dynamics with electrons | eng |
| dc.type | JOURNAL_ARTICLE | de |
| dspace.entity.type | Publication | |
| kops.citation.bibtex | @article{Baum2017-09Captu-43254,
year={2017},
doi={10.1016/j.cplett.2017.03.073},
title={Capturing atomic-scale carrier dynamics with electrons},
volume={683},
issn={0009-2614},
journal={Chemical Physics Letters},
pages={57--61},
author={Baum, Peter and Krausz, Ferenc}
} | |
| kops.citation.iso690 | BAUM, Peter, Ferenc KRAUSZ, 2017. Capturing atomic-scale carrier dynamics with electrons. In: Chemical Physics Letters. 2017, 683, pp. 57-61. ISSN 0009-2614. eISSN 1873-4448. Available under: doi: 10.1016/j.cplett.2017.03.073 | deu |
| kops.citation.iso690 | BAUM, Peter, Ferenc KRAUSZ, 2017. Capturing atomic-scale carrier dynamics with electrons. In: Chemical Physics Letters. 2017, 683, pp. 57-61. ISSN 0009-2614. eISSN 1873-4448. Available under: doi: 10.1016/j.cplett.2017.03.073 | eng |
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<dcterms:abstract xml:lang="eng">Light-driven electronic motion unfolds on times as short as the cycle period of light and on length scales as small as the distance between two neighboring atoms in a molecule. Visualizing fundamental light-matter interactions therefore requires access to attosecond and picometer dimensions. Here we report on a potential unification of electron diffraction and microscopy with attosecond technology, which could provide a full space-time access to elementary electronic processes in matter and materials. We review recent progress in ultrafast diffraction and microscopy towards temporal resolutions approaching 10 fs by use of state-of-the-art microwave technology and discuss our latest findings on all-optical compression approaches for reaching sub-femtosecond, sub-optical-cycle resolution. Four-dimensional electron diffraction with attosecond-picometer resolution will access all dynamics outside the atomic core, offering an all-embracing insight into fundamental electron-nuclear dynamics of complex materials.</dcterms:abstract>
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| kops.sourcefield | Chemical Physics Letters. 2017, <b>683</b>, pp. 57-61. ISSN 0009-2614. eISSN 1873-4448. Available under: doi: 10.1016/j.cplett.2017.03.073 | deu |
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| kops.sourcefield.plain | Chemical Physics Letters. 2017, 683, pp. 57-61. ISSN 0009-2614. eISSN 1873-4448. Available under: doi: 10.1016/j.cplett.2017.03.073 | eng |
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