Surface plasmon enhanced transient themoreflectance

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084_applphysA_1990.pdf
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1990
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Herminghaus, Stephan
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Applied Physics / A, Materials Science and Processing. 1990, 51(4), pp. 350-353. Available under: doi: 10.1007/BF00324319
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It is shown that optically excited surface plasmons can be used for measurements of the surface temperature of a metal with nanosecond the resolution. This method is closely related to transient thermoreflectance, but its sensitivity is considerably higher. We give a survey on the mechanisms involved, briefly discussing the dependence on the sample properties. Experimental confirmation of the proposed sensitivity enhancement as well as the time resolution is presented.

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ISO 690HERMINGHAUS, Stephan, Paul LEIDERER, 1990. Surface plasmon enhanced transient themoreflectance. In: Applied Physics / A, Materials Science and Processing. 1990, 51(4), pp. 350-353. Available under: doi: 10.1007/BF00324319
BibTex
@article{Herminghaus1990Surfa-9502,
  year={1990},
  doi={10.1007/BF00324319},
  title={Surface plasmon enhanced transient themoreflectance},
  number={4},
  volume={51},
  journal={Applied Physics / A, Materials Science and Processing},
  pages={350--353},
  author={Herminghaus, Stephan and Leiderer, Paul}
}
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