Tunable Fröhlich polarons in organic single-crystal transistors

dc.contributor.authorHulea, Iulian N.
dc.contributor.authorFratini, Simone
dc.contributor.authorXie, H.
dc.contributor.authorMulder, Cornelis L.
dc.contributor.authorIossad, Nikolai N.
dc.contributor.authorRastelli, Gianluca
dc.contributor.authorCiuchi, Sergio
dc.contributor.authorMorpurgo, Alberto F.
dc.date.accessioned2019-07-30T09:45:43Z
dc.date.available2019-07-30T09:45:43Z
dc.date.issued2006-12eng
dc.description.abstractIn organic field-effect transistors (FETs), charges move near the surface of an organic semiconductor, at the interface with a dielectric. In the past, the nature of the microscopic motion of charge carriers—which determines the device performance—has been related to the quality of the organic semiconductor. Recently, it was discovered that the nearby dielectric also has an unexpectedly strong influence. The mechanisms responsible for this influence are not understood. To investigate these mechanisms, we have studied transport through organic single-crystal FETs with different gate insulators. We find that the temperature dependence of the mobility evolves from metallic-like to insulating-like with increasing dielectric constant of the insulator. The phenomenon is accounted for by a two-dimensional Fröhlich polaron model that quantitatively describes our observations and shows that increasing the dielectric polarizability results in a crossover from the weak to the strong polaronic coupling regime. This represents a considerable step forward in our understanding of transport through organic transistors, and identifies a microscopic physical process with a large influence on device performance.eng
dc.description.versionpublishedeng
dc.identifier.arxivcond-mat/0612084eng
dc.identifier.doi10.1038/nmat1774eng
dc.identifier.pmid17086169eng
dc.identifier.urihttps://kops.uni-konstanz.de/handle/123456789/46551
dc.language.isoengeng
dc.subject.ddc530eng
dc.titleTunable Fröhlich polarons in organic single-crystal transistorseng
dc.typeJOURNAL_ARTICLEeng
dspace.entity.typePublication
kops.citation.bibtex
@article{Hulea2006-12Tunab-46551,
  year={2006},
  doi={10.1038/nmat1774},
  title={Tunable Fröhlich polarons in organic single-crystal transistors},
  number={12},
  volume={5},
  issn={1476-1122},
  journal={Nature Materials},
  pages={982--986},
  author={Hulea, Iulian N. and Fratini, Simone and Xie, H. and Mulder, Cornelis L. and Iossad, Nikolai N. and Rastelli, Gianluca and Ciuchi, Sergio and Morpurgo, Alberto F.}
}
kops.citation.iso690HULEA, Iulian N., Simone FRATINI, H. XIE, Cornelis L. MULDER, Nikolai N. IOSSAD, Gianluca RASTELLI, Sergio CIUCHI, Alberto F. MORPURGO, 2006. Tunable Fröhlich polarons in organic single-crystal transistors. In: Nature Materials. 2006, 5(12), pp. 982-986. ISSN 1476-1122. eISSN 1476-4660. Available under: doi: 10.1038/nmat1774deu
kops.citation.iso690HULEA, Iulian N., Simone FRATINI, H. XIE, Cornelis L. MULDER, Nikolai N. IOSSAD, Gianluca RASTELLI, Sergio CIUCHI, Alberto F. MORPURGO, 2006. Tunable Fröhlich polarons in organic single-crystal transistors. In: Nature Materials. 2006, 5(12), pp. 982-986. ISSN 1476-1122. eISSN 1476-4660. Available under: doi: 10.1038/nmat1774eng
kops.citation.rdf
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/46551">
    <dc:contributor>Rastelli, Gianluca</dc:contributor>
    <dcterms:title>Tunable Fröhlich polarons in organic single-crystal transistors</dcterms:title>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:contributor>Ciuchi, Sergio</dc:contributor>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/52"/>
    <dc:contributor>Hulea, Iulian N.</dc:contributor>
    <dc:contributor>Xie, H.</dc:contributor>
    <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/46551"/>
    <dc:contributor>Fratini, Simone</dc:contributor>
    <dc:language>eng</dc:language>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/52"/>
    <dcterms:issued>2006-12</dcterms:issued>
    <dc:creator>Mulder, Cornelis L.</dc:creator>
    <dc:contributor>Mulder, Cornelis L.</dc:contributor>
    <dc:creator>Ciuchi, Sergio</dc:creator>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dcterms:abstract xml:lang="eng">In organic field-effect transistors (FETs), charges move near the surface of an organic semiconductor, at the interface with a dielectric. In the past, the nature of the microscopic motion of charge carriers—which determines the device performance—has been related to the quality of the organic semiconductor. Recently, it was discovered that the nearby dielectric also has an unexpectedly strong influence. The mechanisms responsible for this influence are not understood. To investigate these mechanisms, we have studied transport through organic single-crystal FETs with different gate insulators. We find that the temperature dependence of the mobility evolves from metallic-like to insulating-like with increasing dielectric constant of the insulator. The phenomenon is accounted for by a two-dimensional Fröhlich polaron model that quantitatively describes our observations and shows that increasing the dielectric polarizability results in a crossover from the weak to the strong polaronic coupling regime. This represents a considerable step forward in our understanding of transport through organic transistors, and identifies a microscopic physical process with a large influence on device performance.</dcterms:abstract>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2019-07-30T09:45:43Z</dc:date>
    <dc:creator>Xie, H.</dc:creator>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:creator>Morpurgo, Alberto F.</dc:creator>
    <dc:creator>Fratini, Simone</dc:creator>
    <dc:creator>Iossad, Nikolai N.</dc:creator>
    <dc:creator>Hulea, Iulian N.</dc:creator>
    <dc:creator>Rastelli, Gianluca</dc:creator>
    <dc:contributor>Iossad, Nikolai N.</dc:contributor>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2019-07-30T09:45:43Z</dcterms:available>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:contributor>Morpurgo, Alberto F.</dc:contributor>
  </rdf:Description>
</rdf:RDF>
kops.flag.isPeerReviewedtrueeng
kops.flag.knbibliographyfalse
kops.sourcefieldNature Materials. 2006, <b>5</b>(12), pp. 982-986. ISSN 1476-1122. eISSN 1476-4660. Available under: doi: 10.1038/nmat1774deu
kops.sourcefield.plainNature Materials. 2006, 5(12), pp. 982-986. ISSN 1476-1122. eISSN 1476-4660. Available under: doi: 10.1038/nmat1774deu
kops.sourcefield.plainNature Materials. 2006, 5(12), pp. 982-986. ISSN 1476-1122. eISSN 1476-4660. Available under: doi: 10.1038/nmat1774eng
relation.isAuthorOfPublicationa1df7947-4c79-4216-8e24-3771667a6e00
relation.isAuthorOfPublication.latestForDiscoverya1df7947-4c79-4216-8e24-3771667a6e00
source.bibliographicInfo.fromPage982eng
source.bibliographicInfo.issue12eng
source.bibliographicInfo.toPage986eng
source.bibliographicInfo.volume5eng
source.identifier.eissn1476-4660eng
source.identifier.issn1476-1122eng
source.periodicalTitleNature Materialseng

Dateien