KOPS - Das Institutionelle Repositorium der Universität Konstanz

Fast illuminated lock-in thermography : an inline shunt detection measurement tool

Fast illuminated lock-in thermography : an inline shunt detection measurement tool

Zitieren

Dateien zu dieser Ressource

Dateien Größe Format Anzeige

Zu diesem Dokument gibt es keine Dateien.

SEREN, Sven, Giso HAHN, Carsten DEMBERGER, H. NAGEL, 2008. Fast illuminated lock-in thermography : an inline shunt detection measurement tool. In: 33rd IEEE Photovoltaic Specialists Conference, 2008 : PVSC '08 ; 11 - 16 May 2008, San Diego, California. Piscataway, NJ:IEEE. ISBN 978-1-4244-1640-0

@inproceedings{Seren2008illum-987, title={Fast illuminated lock-in thermography : an inline shunt detection measurement tool}, year={2008}, isbn={978-1-4244-1640-0}, address={Piscataway, NJ}, publisher={IEEE}, booktitle={33rd IEEE Photovoltaic Specialists Conference, 2008 : PVSC '08 ; 11 - 16 May 2008, San Diego, California}, author={Seren, Sven and Hahn, Giso and Demberger, Carsten and Nagel, H.} }

<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/987"> <dcterms:bibliographicCitation>Publ. in: Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, San Diego 2008. US: Institute of Electrical and Electronics Engineers, 2008</dcterms:bibliographicCitation> <dc:contributor>Seren, Sven</dc:contributor> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/987"/> <dcterms:abstract xml:lang="eng">This paper focuses on the fast spatially resolved detection of material and / or processing induced shunting using fast illuminated Lock-In Thermography (iLIT). With this technique shunting can be detected spatially resolved within a measurement time of only 1 s and thus the method in principle can be used for inline characterisation. Points addressed are the influence of Lock-In frequency on spatial resolution and the effect of a lowered illumination intensity for a better selectivity between shunting and recombination induced generation of heat. The method is tested for different common sources of shunting in standard industrial-type solar cells (points like shunts, cracks, poor edge isolation, contaminations) and all major types of shunts under investigation can be detected in times relevant for inline characterisation.</dcterms:abstract> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-22T17:52:39Z</dcterms:available> <dc:creator>Seren, Sven</dc:creator> <dc:rights>deposit-license</dc:rights> <dc:contributor>Nagel, H.</dc:contributor> <dc:creator>Nagel, H.</dc:creator> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dcterms:issued>2008</dcterms:issued> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dcterms:title>Fast illuminated lock-in thermography : an inline shunt detection measurement tool</dcterms:title> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-22T17:52:39Z</dc:date> <dc:creator>Demberger, Carsten</dc:creator> <dc:creator>Hahn, Giso</dc:creator> <dc:contributor>Demberger, Carsten</dc:contributor> <dc:language>eng</dc:language> <dc:contributor>Hahn, Giso</dc:contributor> <dcterms:rights rdf:resource="http://nbn-resolving.org/urn:nbn:de:bsz:352-20140905103416863-3868037-7"/> </rdf:Description> </rdf:RDF>

Das Dokument erscheint in:

KOPS Suche


Stöbern

Mein Benutzerkonto