Surface plasmon enhanced transient themoreflectance

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HERMINGHAUS, Stephan, Paul LEIDERER, 1990. Surface plasmon enhanced transient themoreflectance. In: Applied Physics / A, Materials Science and Processing. 51(4), pp. 350-353

@article{Herminghaus1990Surfa-9502, title={Surface plasmon enhanced transient themoreflectance}, year={1990}, doi={10.1007/BF00324319}, number={4}, volume={51}, journal={Applied Physics / A, Materials Science and Processing}, pages={350--353}, author={Herminghaus, Stephan and Leiderer, Paul} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/9502"> <dc:contributor>Leiderer, Paul</dc:contributor> <dc:contributor>Herminghaus, Stephan</dc:contributor> <dc:language>eng</dc:language> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:57:31Z</dc:date> <dc:creator>Leiderer, Paul</dc:creator> <dcterms:issued>1990</dcterms:issued> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-24T17:57:31Z</dcterms:available> <dc:creator>Herminghaus, Stephan</dc:creator> <dc:format>application/pdf</dc:format> <dcterms:bibliographicCitation>First publ. in: Applied Physics / A, Materials Science and Processing, 51 (1990), 4, pp. 350-353</dcterms:bibliographicCitation> <dcterms:rights rdf:resource="https://creativecommons.org/licenses/by-nc-nd/2.0/legalcode"/> <dc:rights>deposit-license</dc:rights> <dcterms:title>Surface plasmon enhanced transient themoreflectance</dcterms:title> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/9502"/> <dcterms:abstract xml:lang="eng">It is shown that optically excited surface plasmons can be used for measurements of the surface temperature of a metal with nanosecond the resolution. This method is closely related to transient thermoreflectance, but its sensitivity is considerably higher. We give a survey on the mechanisms involved, briefly discussing the dependence on the sample properties. Experimental confirmation of the proposed sensitivity enhancement as well as the time resolution is presented.</dcterms:abstract> </rdf:Description> </rdf:RDF>

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