Temperature induced degradation of the contact resistance of Ag-screen printed p-type silicon solar cells
| Publikationstyp: | Beitrag zu einer Konferenz |
| URI (zitierfähiger Link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-opus-103826 |
| Autor/innen: | Herguth, Axel; Hahn, Giso |
| Erscheinungsjahr: | 2009 |
| Konferenz: | 24th European Photovoltaic Solar Energy Conference, 21. Sep 2009 - 25. Sep 2009, Hamburg |
| Erschienen in: | Proceedings of the 24th European Photovoltaic Solar Energy Conference. - Munich, Germany : WIP-Renewable Energies, 2009. - S. 2012-2014. - ISBN 3-936338-25-6 |
| DOI (zitierfähiger Link): | https://dx.doi.org/10.4229/24thEUPVSEC2009-2DV.1.7 |
| Zusammenfassung: |
This contribution targets on the stability of screen printed silver front contacts on n-type emitters of crystalline silicon solar cells during thermal treatment steps in the range of 200-300°C which could be of importance for e.g. some dielectric layers or Regeneration. As measurements of the contact resistance taken by TLM technique reveal, the contact resistance may seriously increase within the thermal treatment steps giving rise to a significant degradation of the fill factor of the solar cell. Furthermore it is found that the TLM technique itself has an influence on the measurements.
|
| Fachgebiet (DDC): | 530 Physik |
| Schlagwörter: | Front contact, Thermal, Degradation |
| Link zur Lizenz: | Nutzungsbedingungen |
| Universitätsbibliographie: | Ja |
Zitieren
Dateien zu dieser Ressource
![[PDF]](/themes/Kops/images/mimes/pdf.png "PDF file"){kind=small}
HERGUTH, Axel, Giso HAHN, 2009. Temperature induced degradation of the contact resistance of Ag-screen printed p-type silicon solar cells. 24th European Photovoltaic Solar Energy Conference. Hamburg, 21. Sep 2009 - 25. Sep 2009. In: Proceedings of the 24th European Photovoltaic Solar Energy Conference. Munich, Germany:WIP-Renewable Energies, pp. 2012-2014. ISBN 3-936338-25-6. Available under: doi: 10.4229/24thEUPVSEC2009-2DV.1.7
@inproceedings{Herguth2009Tempe-946, title={Temperature induced degradation of the contact resistance of Ag-screen printed p-type silicon solar cells}, year={2009}, doi={10.4229/24thEUPVSEC2009-2DV.1.7}, isbn={3-936338-25-6}, address={Munich, Germany}, publisher={WIP-Renewable Energies}, booktitle={Proceedings of the 24th European Photovoltaic Solar Energy Conference}, pages={2012--2014}, author={Herguth, Axel and Hahn, Giso} }
<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/946"> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-22T17:52:24Z</dcterms:available> <dc:contributor>Hahn, Giso</dc:contributor> <dcterms:bibliographicCitation>First publ. in: Proceedings of the 24th European Photovoltaic Solar Energy Conference, September 2009, Hamburg. München : WIP - Wirtschaft und Infrastruktur, 2009, pp. 2012-2014</dcterms:bibliographicCitation> <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/946/1/Herguth_opus-103826.pdf"/> <dcterms:issued>2009</dcterms:issued> <dc:creator>Herguth, Axel</dc:creator> <dc:contributor>Herguth, Axel</dc:contributor> <dcterms:abstract xml:lang="eng">This contribution targets on the stability of screen printed silver front contacts on n-type emitters of crystalline silicon solar cells during thermal treatment steps in the range of 200-300°C which could be of importance for e.g. some dielectric layers or Regeneration. As measurements of the contact resistance taken by TLM technique reveal, the contact resistance may seriously increase within the thermal treatment steps giving rise to a significant degradation of the fill factor of the solar cell. Furthermore it is found that the TLM technique itself has an influence on the measurements.</dcterms:abstract> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dc:rights>terms-of-use</dc:rights> <dcterms:rights rdf:resource="https://kops.uni-konstanz.de/page/termsofuse"/> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/946"/> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2011-03-22T17:52:24Z</dc:date> <dc:creator>Hahn, Giso</dc:creator> <dc:language>eng</dc:language> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/946/1/Herguth_opus-103826.pdf"/> <dcterms:title>Temperature induced degradation of the contact resistance of Ag-screen printed p-type silicon solar cells</dcterms:title> </rdf:Description> </rdf:RDF>
Dateiabrufe seit 01.10.2014 (Informationen über die Zugriffsstatistik)
| Herguth_opus-103826.pdf | 1 |
Das Dokument erscheint in:
KOPS Suche
Stöbern
Mein Benutzerkonto
