Phase contrast surface mode resonance microscopy

Cite This

Files in this item

Checksum: MD5:a855e3d75a28e3cca74e1e6d174cd8c5

HERMINGHAUS, Stephan, Clemens BECHINGER, W. PETERSEN, Paul LEIDERER, 1994. Phase contrast surface mode resonance microscopy. In: Optics Communications. 112, pp. 16-20. Available under: doi: 10.1016/0030-4018(94)90072-8

@article{Herminghaus1994Phase-9451, title={Phase contrast surface mode resonance microscopy}, year={1994}, doi={10.1016/0030-4018(94)90072-8}, volume={112}, journal={Optics Communications}, pages={16--20}, author={Herminghaus, Stephan and Bechinger, Clemens and Petersen, W. and Leiderer, Paul} }

<rdf:RDF xmlns:dcterms="" xmlns:dc="" xmlns:rdf="" xmlns:bibo="" xmlns:dspace="" xmlns:foaf="" xmlns:void="" xmlns:xsd="" > <rdf:Description rdf:about=""> <dc:date rdf:datatype="">2011-03-24T17:56:42Z</dc:date> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <dspace:isPartOfCollection rdf:resource=""/> <dc:creator>Petersen, W.</dc:creator> <dc:contributor>Bechinger, Clemens</dc:contributor> <dc:creator>Herminghaus, Stephan</dc:creator> <dcterms:available rdf:datatype="">2011-03-24T17:56:42Z</dcterms:available> <dc:rights>terms-of-use</dc:rights> <dc:contributor>Leiderer, Paul</dc:contributor> <dc:creator>Bechinger, Clemens</dc:creator> <bibo:uri rdf:resource=""/> <dc:language>eng</dc:language> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dcterms:issued>1994</dcterms:issued> <dcterms:bibliographicCitation>First publ. in: Optics Communications 112 (1994), pp. 16-20</dcterms:bibliographicCitation> <dc:contributor>Petersen, W.</dc:contributor> <dcterms:abstract xml:lang="eng">A simple method is described which allows to obtain a phase sensitive image in surface mode resonance microscopy. It exploits the fact that surface mode resonances couple only to one dimtion of polarization (s or p) so that the other direction (p or s) can be used as a reference wave. Using a SoleiI-Babinet compensator and a polarizet, the two waves can be phase shifted with respect to each other and superimposed before they are imaged onto a camem chip. The method is demonstrated experimentally. Possible applications are discussed, especiaIly for the field of nonlinear optics of thin films and surfaces, where phase information is particularly desirable.</dcterms:abstract> <dc:format>application/pdf</dc:format> <dcterms:rights rdf:resource=""/> <dc:creator>Leiderer, Paul</dc:creator> <dc:contributor>Herminghaus, Stephan</dc:contributor> <dspace:hasBitstream rdf:resource=""/> <dcterms:hasPart rdf:resource=""/> <dcterms:isPartOf rdf:resource=""/> <dcterms:title>Phase contrast surface mode resonance microscopy</dcterms:title> </rdf:Description> </rdf:RDF>

Downloads since Oct 1, 2014 (Information about access statistics)

150_opticcommun_1994.pdf 159

This item appears in the following Collection(s)

terms-of-use Except where otherwise noted, this item's license is described as terms-of-use

Search KOPS


My Account